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Search Publications by: Eric K. Lin (Fed)

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Displaying 26 - 50 of 199

A Molecular Model for Toughening in Double-Network Hydrogels

June 18, 2008
Author(s)
Vijay Tirumala, Sanghun Lee, Taiki Tominaga, Eric K. Lin, Jian P. Gong, Paul D. Butler, Wen-Li Wu
A molecular mechanism is proposed for the toughness enhancement observed in double network (DN) hydrogels prepared from poly (2 acrylamido, 2-methyl, 1-propanesulfonicacid) (PAMPS) polyelectrolyte network and polyacrylamide (PAAm) linear polymer. It is an

The Impact of the Dielectric / Semiconductor Interface on Microstructure and Charge Carrier Transport in High-Performance Polythiophene Transistors

May 14, 2008
Author(s)
Youngsuk Jung, Regis J. Kline, Eric K. Lin, Daniel A. Fischer, Michael F. Toney, Martin Heeney, Iain McCulloch, Dean DeLongchamp
The performance of organic field-effect transistors (OFETs) significantly depends on the properties of the interface between the semiconductor and gate dielectric. Here, we study the impact of chemically modified and morphologically controlled dielectrics

Self-Sealing Nanoporous Low-k Dielectric Patterns Created by Nanoimprint Lithography

April 15, 2008
Author(s)
Hyun Wook Ro, H Peng, Ken-ich Nihara, Hae-Jeong Lee, Eric K. Lin, Alamgir Karim, D Gidley, Hiropshi Jinai, Do Y. Yoon, Christopher L. Soles
In this letter we describe how highly porous nanostructures can be directly printed into a poly(methylsilsequioxane) (PMSQ)-based organosilicate film, with high pattern fidelity, and develop the measurement infrastructure to quantitatively evaluate the

Characterizing Pattern Structures Using X-Ray Reflectivity

March 28, 2008
Author(s)
Hae-Jeong Lee, Christopher L. Soles, Hyun Wook Ro, Shuhui Kang, Eric K. Lin, Alamgir Karim, Wen-Li Wu
Specular X-ray reflectivity (SXR) can be used, in the limit of the effective medium approximation (EMA), as a high-resolution shape metrology for periodic patterns on a planar substrate. The EMA means that the density of the solid pattern and the space

Line Width Roughness and Cross Sectional Measurements of Sub-50 nm Structures with CD-SAXS and CD-SEM

March 24, 2008
Author(s)
Chengqing C. Wang, Ronald L. Jones, Kwang-Woo Choi, Christopher L. Soles, Eric K. Lin, Wen-Li Wu, James S. Clarke, John S. Villarrubia, Benjamin Bunday
Critical dimension small angle x-ray scattering (CD-SAXS) is a measurement platform which is capable of measuring the average cross section and sidewall roughness in patterns ranging from (10 to 500) nm in pitch with sub nm precision. These capabilities

Structure and Dynamics in Multicomponent Polyelectrolyte Solutions

March 11, 2008
Author(s)
Sanghun Lee, Vijay Tirumala, Michihiro Nagao, Taiki Tominaga, Eric K. Lin, Jian P. Gong, Wen-Li Wu
Double-network hydrogels (DN-gels) prepared from the combination of a moderately crosslinked anionic polyelectrolyte (poly(2-acrylamido-2-methyl-1-propanesulfonic acid, PAMPS) and an uncrosslinked linear polymer (polyacrylamide, PAAm) solution show strong

The Effect of Interfacial Roughness on the Thin Film Morphology and Charge Transport of High-Performance Polythiophenes

March 11, 2008
Author(s)
Y S. Jung, Regis J. Kline, Daniel A. Fischer, Eric K. Lin, Martin Heeney, Iain McCulloch, Dean DeLongchamp
We control and vary the roughness of a dielectric upon which a high-performance polymer semiconductor, poly(2,5-bis(3-alkylthiophen-2-yl)thieno[3,2-b]thiophene) (pBTTT) is cast, to determine the effects of roughness on thin-film microstructure and the

Thermodynamic Interactions in Double-Network Hydrogels

March 11, 2008
Author(s)
Taiki Tominaga, Vijay Tirumala, Sanghun Lee, Eric K. Lin, Jian P. Gong, Wen-Li Wu
Double-network hydrogels (DN-gels) prepared from the combination of a moderately crosslinked anionic polyelectrolyte and an uncrosslinked linear polymer solution exhibit mechanical properties such as fracture toughness that are intriguingly superior to

Single cantilever peel test for analysis of adhesion strength in nanotransfer printing

February 17, 2008
Author(s)
Deuk Y. Lee, Gottlieb Oehrlein, Daniel R. Hines, Jiong Liu, Jun Y. Chung, Christopher Stafford, Christopher Soles, Eric K. Lin
Nanotransfer printing (NTP) has attracted much attention as a method for fabricating nanoscale structures using materials that are not generally compatible with conventional lithographic techniques. For NTP of a polymer film to a polymer substrate, thermal

Critical Role of Side-Chain Attachment Density on the Order and Device Performance of Polythiophenes

October 30, 2007
Author(s)
Regis J. Kline, Dean DeLongchamp, Daniel A. Fischer, Eric K. Lin, Lee J. Richter, Michael L. Chabinyc, Martin Heeney, Iain McCulloch
High performance, solution processable semiconductors are critical to the realization of low cost, large area electronics. We show that a signature molecular packing motif - side-chain interdigitation - correlates to high performance for a large and

Mesoporous Silica Films with Long-Range Order Prepared from Strongly Segregated Block Copolymer/Homopolymer Blend Templates

October 24, 2007
Author(s)
Vijay Tirumala, R A. Pai, Sumit Agarwal, Curran Chandler, Gaurav Bhatnagar, Alvin Omang, Eric K. Lin, J J. Watkins
Well ordered mesoporous silica films were prepared by infusion and selective condensation of Si alkoxides within pre-organized block copolymer/homopolymer blend templates using supercritical CO2 as the delivery medium. The morphologies of mesoporous silica

The Molecular Origin of Enhanced Toughness in Double-Network Hydrogels

October 22, 2007
Author(s)
Taiki Tominaga, Vijay Tirumala, Eric K. Lin, Jian P. Gong, Hidemitsu Furukawa, Yoshihito Osada, Wen-Li Wu
The long-standing pursuit of a synthetic equivalent to tissue cartilage has seen significant new activity with the development of a new materials strategy: double-network hydrogels (DN-gels) prepared from a combination of an anionic polyelectrolyte and a

The Direct Patterning of Nanoporous Interlayer Dielectric Insulator Films by Nanoimprint Lithography

October 2, 2007
Author(s)
Hyun Wook Ro, Ronald L. Jones, H Peng, Daniel R. Hines, Hae-Jeong Lee, Eric K. Lin, Alamgir Karim, Do Y. Yoon, D Gidley, Christopher L. Soles
Directly patterning dielectric insulator materials via nanoimprint lithography has the potential to simplify fabrication processes and significantly reduce the manufacturing costs for semiconductor devices. However, the prospect of mechanically forming

I-NEMI 2007 Organic and Printed Electronics Roadmap

April 2, 2007
Author(s)
Jan Obrzut, Regis J. Kline, Eric K. Lin, David J. Gundlach, Daniel Gamota
This roadmap provides an overview of the most critical technologies necessary for commercial launch and market diffusion of organic & printed electronics based products. To the best of our knowledge, this roadmap is the first of its kind and as such should

High Carrier Mobility Polythiophene Thin Films: Structure Determination by Experiment and Theory

March 19, 2007
Author(s)
Dean M. DeLongchamp, Regis J. Kline, Eric K. Lin, Daniel A. Fischer, Lee J. Richter, Leah A. Lucas, Martin Heeney, Iain McCulloch, John E. Northrup
We exploit the unprecedented crystallinity of poly(2,5-bis(3-alkylthiophene-2-yl)thieno[3,2-b]thiophenes) (pBTTTs) high performance semiconducting polymers to study structural detail within 25 nm thick films of a pBTTT with tetradecyl side chains (pBTTT