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High Carrier Mobility Polythiophene Thin Films: Structure Determination by Experiment and Theory

Published

Author(s)

Dean M. DeLongchamp, Regis J. Kline, Eric K. Lin, Daniel A. Fischer, Lee J. Richter, Leah A. Lucas, Martin Heeney, Iain McCulloch, John E. Northrup

Abstract

We exploit the unprecedented crystallinity of poly(2,5-bis(3-alkylthiophene-2-yl)thieno[3,2-b]thiophenes) (pBTTTs) high performance semiconducting polymers to study structural detail within 25 nm thick films of a pBTTT with tetradecyl side chains (pBTTT-C14). The combination of atomic force microscopy, near -edge X-ray absorption fine structure (NEXAFS) spectroscopy and and infrared absorption spectroscopy reveals stucture more detailed than what can be revealed using conventional X-ray diffraction techniques. We find that the conjugated planes of pBTTT-C14 tilt within their crystalline lamellae, an important structural property theoretically predicted but never before experimentally shown in conjugated polymers.
Citation
Advanced Materials

Keywords

NEXAFS, organic semiconductor, transistor, X-ray absorption spectroscopy

Citation

DeLongchamp, D. , Kline, R. , Lin, E. , Fischer, D. , Richter, L. , Lucas, L. , Heeney, M. , McCulloch, I. and Northrup, J. (2007), High Carrier Mobility Polythiophene Thin Films: Structure Determination by Experiment and Theory, Advanced Materials, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852643 (Accessed June 25, 2024)

Issues

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Created March 19, 2007, Updated February 19, 2017