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NIST Authors in Bold

Displaying 1751 - 1775 of 2714

ISCD-NIST DXA Survey: Preliminary Report

May 15, 2008
Author(s)
Andrew M. Dienstfrey, Tammy L. Oreskovic, Lawrence T. Hudson, Herbert S. Bennett
This article reports and discusses briefly the preliminary results from the recent International Society for Clinical Densitometry (ISCD)-National Institute of Standards and Technology (NIST) dual-energy x-ray absorptiometry (DXA) Survey. The 1074 Survey

Gauge Blocks - A Zombie Technology

May 1, 2008
Author(s)
Theodore D. Doiron
Gauge blocks have been the primary method for disseminating length traceability for over 100 years. Their longevity was based on two things: it was relatively inexpensive to deliver very high accuracy to users, and the technical limitation that the range

Mode-selective acoustic spectroscopy of trigonal piezoelectric crystals

May 1, 2008
Author(s)
Ward L. Johnson, Carlos F. Martino, Sudook A. Kim, Paul R. Heyliger
A noncontacting electromagnetic-acoustic-resonance technique is presented for generating and detecting vibrational modes with prescribed symmetries in piezoelectric trigonal crystals with cylindrical geometry. This technique provides the experimental basis

Physical characterization methods for iron-oxide contrast agents encapsulated within a targeted liposome-based delivery system

April 16, 2008
Author(s)
John A. Dagata, Natalia Farkas, Cindi L. Dennis, Robert D. Shull, Vincent A. Hackley, Charles W. Yang, Kathleen F. Pirollo, Esther H. Chang
Intact liposome-based targeted nanoparticle delivery systems (NDS) are immobilized by nonselective binding and characterized by scanning probe microscopy (SPM) in a fluid imaging environment. The size, size distribution, functionality, and stability of an

Measurements to Support Modulated-Signal Radio Transmissions for the Public-Safety Sector

April 1, 2008
Author(s)
Catherine A. Remley, Galen H. Koepke, Christopher L. Holloway, Chriss A. Grosvenor, Dennis G. Camell, John M. Ladbury, Robert Johnk, David R. Novotny, William F. Young, George Hough, Michael McKinley, Yann Becquet, John Korsnes
We report on measurements of parameters utilized for characterization of broadband wireless technologies proposed for use by emergency responders (firefighters, police, and emergency medical personnel) and other public-safety personnel. We designed a

The International System of Units (SI), 2008 Edition

April 1, 2008
Author(s)
Barry N. Taylor
The definitive international reference on the SI is a booklet published by the International Bureau of Weights and Measures (BIPM, Bureau International des Poids et Mesures) and often referred to as the BIPM SI Brochure. Entitled Le Systeme International d

HYDROGEN PIPELINE RESEARCH AT NIST

March 31, 2008
Author(s)
Thomas A. Siewert, Joseph D. McColskey, Angelique N. Lasseigne
In 2007, the National Institute of Standards and Technology greatly expanded its efforts in support of the use of hydrogen as a fuel. Various NIST divisions have started projects on measurement needs in the areas of flow rates, storage, materials

Towards Accurate Feature Shape Metrology

March 22, 2008
Author(s)
Ndubuisi G. Orji, Ronald G. Dixson, B Bunday, J Allgair
Over the last few years, the need for shape metrology for process control has increased. A key component of shape metrology is sidewall angle (SWA). However, few instruments measure SWA directly. The critical dimension atomic force microscope (CD-AFM) is

Defining Units in the Quantum SI

February 18, 2008
Author(s)
Peter J. Mohr
Possible changes to the International System of Units (SI) are being discussed, including a proposal to define the units by specifying the values of a set of fundamental constants. This note is meant to be an elementary guide to the algebra associated with

The Potentials of Helium Ion Microscopy for Semiconductor Process Metrology

February 6, 2008
Author(s)
Michael T. Postek, Andras Vladar
Semiconductor manufacturing is always looking for more effective ways to monitor and control the manufacturing process. Helium Ion Microscopy (HIM) presents a new approach to process monitoring which has several potential advantages over the traditional

Line Width Measurement Technique Using Through-Focus Optical Images

January 1, 2008
Author(s)
Ravikiran Attota, Richard M. Silver, Ronald G. Dixson
We present a detailed experimental study of a new through-focus technique to measure line width (CD) with nanometer sensitivity using a bright field optical microscope. This method relies on analyzing intensity gradients in optical images at different

International Legal Metrology Organizational Primer

December 31, 2007
Author(s)
S. W. Stiefel
The world's metrology and legal metrology infrastructure abounds with organizations that play differing roles such as measurement research, standards, and accreditation. Associated with these organizations is a bewildering assortment of acronyms. This

Nano- and Atomic-Scale Length Metrology

December 14, 2007
Author(s)
Theodore V. Vorburger, Ronald G. Dixson, Joseph Fu, Ndubuisi G. Orji, Shaw C. Feng, Michael W. Cresswell, Richard A. Allen, William F. Guthrie, Wei Chu

NIST HB-1A Energy Efficient Lighting - Solid State Luminaires

December 7, 2007
Author(s)
C Cameron Miller, Lawrence I. Knab, Ambler Thompson, Jon M. Crickenberger
NIST Handbook 150-1A presents technical requirements and guidance for the accreditation of laboratories under the National Voluntary Laboratory Accreditation Program (NVLAP) Energy Efficient Lighting/Solid State luminaires program. It is intended for

Photomask Applications of Traceable Atomic Force Microscope Dimensional Metrology at NIST

October 1, 2007
Author(s)
Ronald G. Dixson, Ndubuisi G. Orji, James E. Potzick, Joseph Fu, Michael W. Cresswell, Richard A. Allen, S J. Smith, Anthony J. Walton
The National Institute of Standards and Technology (NIST) has a multifaceted program in AFM dimensional metrology. Two major instruments are being used for traceable measurements. The first is a custom in-house metrology AFM, called the calibrated AFM (C
Displaying 1751 - 1775 of 2714
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