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PUBLICATIONS

A New Oscillator for SI-Traceable Measurements in Atomic Force Microscopy

Published

Author(s)

Gregory W. Vogl, Jason J. Gorman, Gordon A. Shaw, Jon R. Pratt

Abstract

See attached.
Proceedings Title
12th Conference on Nonlinear Vibrations, Dynamics, and Multibody Systems
Conference Dates
June 1-5, 2008
Conference Location
Blacksburg, VA
Pub Type
Conferences

Download Paper

Local Download

Keywords

AFM cantilever calibration, electrostatic forces, limit cycle, magnetic actuation, magnetic sensing, micro-oscillator, Si-traceable nanoforces, velocity standard.
Chemical engineering and processing and Metrology

Citation

Vogl, G. , Gorman, J. , Shaw, G. and Pratt, J. (2008), A New Oscillator for SI-Traceable Measurements in Atomic Force Microscopy, 12th Conference on Nonlinear Vibrations, Dynamics, and Multibody Systems, Blacksburg, VA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=824441 (Accessed October 18, 2025)

Issues

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Created June 1, 2008, Updated February 19, 2017
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