Attota, R.
and Silver, R.
(2008),
Through-focus scanning optical microscope imaging method for nano-scale dimensional analysis, Optics Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=824668
(Accessed October 16, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Through-focus scanning optical microscope imaging method for nano-scale dimensional analysis
Published
Author(s)
,
Abstract
We present a novel optical technique that produces nanometer dimensional measurement sensitivity using a conventional bright-field optical microscope, by analyzing two-dimensional through-focus scanning optical microscope (TSOM) images constructed using a set of images obtained at different focus positions. The TSOM images enable one to (i) positively identify the dimension that is different between two nano-sized targets, (ii) determine magnitude of its difference, and (iii) determine the actual dimension by a library matching method. This methodology has potential usefulness for a wide range of targets, geometries and application areas, including, nano-metrology, micro/nanotechnology, semiconductor technology, biotechnology, process control, defect analysis, and nano-manufacturing.Citation
Optics Letters
Volume
33
Issue
17
Pub Type
Journals
Download Paper
Keywords
Optical microscope, TSOM, Nano-metrology, Micro/nanotechnology, Semiconductor technology, Biotechnology, Process control, Defect analysis, Nano-manufacturing.
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created September 1, 2008, Updated February 19, 2017