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Measuring the Phase Transfer Function of a Phase-Shifting Interferometer



JiYoung Chu, Quandou (. Wang, John P. Lehan, Ulf Griesmann, Guangjun Gao


In characterizing the performance of a phase-shifting interferometer, the dependence of the measured height on the spatial frequency is rarely considered. We describe a test mirror with a special height relief that can be used to measure the height transfer function for the interferometer in a fashion analogous to the measurement of the modulation transfer function for the optical imaging system. We fabricated the test mirror at the National Institute of Standards and Technology (NIST) using a lithography-based process. The test mirror has several patterns (reminiscent of moth antennae) with variable spacing in radial direction. We describe the fabrication of the test mirror and its application to test the performance of the interferometer.
Proceedings Title
Proceedings of SPIE Volume 7064: Interferometry XIV: Applications
Conference Dates
August 10-14, 2008
Conference Location
San Diego, CA
Conference Title
SPIE Optics and Photonics 2008


Modulation transfer function, height transfer function, interferometer, lithography.


Chu, J. , Wang, Q. , Lehan, J. , Griesmann, U. and Gao, G. (2008), Measuring the Phase Transfer Function of a Phase-Shifting Interferometer, Proceedings of SPIE Volume 7064: Interferometry XIV: Applications, San Diego, CA, [online], (Accessed April 16, 2024)
Created August 13, 2008, Updated February 19, 2017