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Search Publications

NIST Authors in Bold

Displaying 1626 - 1650 of 2714

Update on DMIS Certification

October 1, 2009
Author(s)
William G. Rippey
The Dimensional Standards Consortium (DMSC) and the National Institute of Standards and Technology (NIST) announced the rollout of the DMSC's DMIS Certification Program at the International Manufacturing Technology Show (IMTS), September 2008. The

A Novel Method to Covalently Functionalize Carbon Nanotubes with Isocyanates

September 30, 2009
Author(s)
Tinh Nguyen, Aline Granier, Kristen L. Steffens, Hajin Lee, Naomi Eidelman, Jonathan W. Martin
We have developed a novel method to covalently functionalize carbon nanotubes (CNTs) that carry free isocyanate (N=C=O) groups. NCO-functionalized CNTs (NCO-fCNTs) are very desirable, because the NCO group is highly reactive with hydrogen-active groups

Gauging the Repeatability of 3D Imaging Systems by Sphere Fitting

September 30, 2009
Author(s)
Marek Franaszek, Geraldine S. Cheok, Kamel S. Saidi
Multiple scans of the same object acquired with 3D imaging system (e.g., laser scanner) in the same experimental conditions could provide valuable information about the instrument s performance (e.g., stability, existence of bias, measurement error)

MEASUREMENTS FOR MECHANICAL RELIABILITY OF THIN FILMS

September 23, 2009
Author(s)
David T. Read, Alex Volinsky
This paper reviews techniques for measurement of basic mechanical properties of thin films. Emphasis is placed on the adaptations needed to prepare, handle, and characterize thin films, and on adaptations of fracture mechanics for adhesion strength. The

Unified Model for Bulk Acoustic Wave Resonators Nonlinear Effects

September 20, 2009
Author(s)
Eduard Rocas, Juan C. Collado Gomez, James C. Booth, Enrique Iborra, Robert Aigner
We present a nonlinear model for Bulk Acoustic Wave resonators that combines different sources of nonlinearity, using device-independent material specific parameters, to predict the intermodulation and harmonics generation. The actual model accounts for

GEOMETRIC MEASUREMENT COMPARISONS FOR ROCKWELL DIAMOND INDENTERS

September 6, 2009
Author(s)
Jun-Feng Song, Samuel R. Low III, Xiaoyu A. Zheng
In the uncertainty budget of Rockwell C hardness (HRC) tests, geometric error of the Rockwell diamond indenter is a major contributor. The geometric calibration of Rockwell diamond indenters has been a key issue for Rockwell hardness standardization. The

Overview of the TAC 2008 Update Summarization Task

September 4, 2009
Author(s)
Hoa T. Dang, Karolina K. Owczarzak
The summarization track at the Text Analysis Conference (TAC) is a direct continuation of the Document Understanding Conference (DUC) series of workshops, focused on providing common data and evaluation framework for research in automatic summarization. In

Analog BIST Functionality for Microhotplate Temperature Sensors

September 1, 2009
Author(s)
Muhammad Y. Afridi, Christopher B. Montgomery, Elliott cooper-Balis, Stephen Semancik, Kenneth G. Kreider, Jon C. Geist
In this paper we describe a novel microhotplate temperature sensor calibration technique suitable for Built-In Self Test. The technique only requires short-term temperature stability from the four-wire polysilicon heater/temperature sensors that are

Perturbations from Ducts on the Modes of Acoustic Thermometers

September 1, 2009
Author(s)
Keith A. Gillis, Michael R. Moldover, Hong Lin
We examine the perturbations of the modes of an acoustic thermometer caused by circular ducts used either for gas flow or as acoustic waveguides coupled to remote transducers. We calculate the acoustic admittance of circular ducts using a model based on

193 nm Angle-Resolved Scatterfield Microscope for Semiconductor Metrology

August 24, 2009
Author(s)
Martin Y. Sohn, Richard Quintanilha, Bryan M. Barnes, Richard M. Silver
An angle-resolved scatterfield microscope (ARSM( feating 193 nm excimer laser light wa developed for measuring critical dimension (CD) and overlay of nanoscale targets as used in semiconductor metrology. The microscope is designed to have a wide and

A moving window correlation method to reduce the distortion of SPM images

August 20, 2009
Author(s)
Wei Chu, Joseph Fu, Ronald G. Dixson, Ndubuisi G. Orji, Theodore V. Vorburger
Many scanning probe microscopes (SPMs), such as the scanning tunneling microscope (STM) and atomic force microscope (AFM), use piezoelectric actuators operating in open loop for generating the scans of the surfaces. However, nonlinearities mainly caused by

Glassy Carbon as an Absolute Intensity Calibration Standard for Small Angle Scattering

August 19, 2009
Author(s)
Andrew J. Allen, Jan Ilavsky, Fan Zhang, Gabrielle G. Long, Pete R. Jemian
Absolute calibration of small-angle scattering (SAS) intensity data (in units of differential cross-section per unit sample volume per unit solid angle) is essential for many important aspects of quantitative SAS analysis, such as obtaining the number

System Builders Manual for Version 2.1.5 of the NIST DMIS Test Suite

August 19, 2009
Author(s)
Thomas R. Kramer, John A. Horst
This is a system builders manual for the NIST DMIS Test Suite, version 2.1.5. The purpose of the manual is to help system builders use software provided in the test suite for building systems that implement DMIS (the Dimensional Measuring Interface

Users Manual for Version 2.1.5 of the NIST DMIS Test Suite (for DMIS 5.1)

August 19, 2009
Author(s)
Thomas R. Kramer, John A. Horst
The NIST DMIS Test Suite, version 2.1.5, is described. The test suite is intended to serve two purposes, 1) to help users and vendors use version 5.1 of DMIS (the Dimensional Measuring Interface Standard) and 2) to provide utilities and test files for

Nanoscale Photoresponse in Blended Organic Photovoltaics

August 16, 2009
Author(s)
Behrang H. Hamadani, Suyong S. Jung, Nikolai B. Zhitenev
Organic solar cells, which have attracted considerable interest over the last few years as low-cost, simply-processed alternatives for harvesting the solar energy, have interesting nanoscale properties; a thorough understanding of which is currently

Coalescing GSICS Correction Coefficients

August 14, 2009
Author(s)
Ruediger Kessel
We would like to present a technique to adjust the uncertainty estimates of each point in a time series, so that the variance of the time series is consistent with the uncertainty estimates of its component points. This would allow the uncertainty of the

Dynamic Gravitational Standard for Liquid Flow: Model and Measurements

August 14, 2009
Author(s)
Iosif I. Shinder, Michael R. Moldover
We report progress in testing a dynamic gravimetric standard using both steady and unsteady water flows. For steady flows in the range 10 kg/s to 60 kg/s, the difference between the dynamic standard and NIST s static primary standard was 0.015 % with a

The Calculation of Natural Gas Viscosity

August 14, 2009
Author(s)
Aaron N. Johnson, William Johansen
The calculation of natural gas viscosity has been implemented many different ways including the use of constants. Different methods of calculating natural gas viscosity may produce values with differences as large as 50%. Increasing natural gas prices

Reference measurements of Hydrogen's Dielectric Permittivity

August 10, 2009
Author(s)
James W. Schmidt, Michael R. Moldover, Eric F. May
We used a quasi-spherical cavity resonator to measure the relative dielectric permittivity ε r of H 2 at frequencies from 2.4 GHz to 7.3 GHz, at pressures up to 6.5 MPa, and at the temperatures 273 K and 293 K. The resonator was calibrated using auxiliary

High Definition Flow

August 1, 2009
Author(s)
John D. Wright, Michael R. Moldover
From pharmaceutical production to the natural gas market, exact flow measurements are critical. Here's how NIST helps keep us all on the same page.
Displaying 1626 - 1650 of 2714
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