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Search Publications

NIST Authors in Bold

Displaying 14801 - 14825 of 73697

Multiplexed sub-Doppler spectroscopy with an optical frequency comb

December 13, 2016
Author(s)
David A. Long, Adam J. Fleisher, David F. Plusquellic, Joseph T. Hodges
An optical frequency comb generated with an electro-optic phase modulator and a chirped radiofrequency waveform is used to perform saturation spectroscopy on the D1 and D2 transitions of atomic potassium. With a comb tooth spacing of 2 MHz and a bandwidth

NIST Handbook 105-4: Specifications and Tolerances for Reference Standards and Field Standard Weights and Measures, Specifications and Tolerances for Liquefied Petroleum Gas and Anhydrous Ammonia Liquid Volumetric Provers (2016 Ed.)

December 13, 2016
Author(s)
Georgia L. Harris, Val R. Miller
These specifications and tolerances are recommended as minimum requirements for standards used by state and local weights and measures officials and others in the regulatory verification of meters used in quantity determination of pressurized liquid

Rheological Measurement of Suspensions Without Slippage: Experimental and Model

December 13, 2016
Author(s)
Alex Olivas, Michelle A. Helsel, Nicos Martys, Chiara C. Ferraris, William L. George, Raissa Ferron
The conclusion of international studies was that the optimal approach to calibrate concrete rheometers would be to develop a non-Newtonian standard reference material (SRM) that contained inclusions similar in size to aggregates used commonly in concrete

Event model to facilitate data sharing among services

December 12, 2016
Author(s)
Olivera Kotevska, Judith R. Gelernter
Development of smart city services is presently hindered because the data is too heterogeneous, despite the increasing availability of data in open data initiatives. We determined metadata fields and semantics for our proposed model after a survey of other

InGaAs Inversion Layer Mobility and Interface Trap Density from Gated Hall Measurements

December 12, 2016
Author(s)
Thenappan Chidambaram, Dmitry Veksler, S Madisetti, Michael Yakimov, Vadim Tokranov, Serge Oktyabrskiy
In this work, we use gated Hall method for direct measurement of free carrier density and electron mobility in inversion InGaAs MOSFET channels. At room temperature, the highest Hall mobility of 1800 cm2/Vs is observed at electron density in the channel

Recommendation: Closed Circuit Television(CCTV) Digital Video Export Profile - Level 0

December 12, 2016
Author(s)
Michael Garris, Mary T. Laamanen, Craig S. Russell, Lawrence D. Nadel
This document is a recommendation prescribing a data interchange format for the syntactic representation of information needed to achieve a base "Level 0" of interoperability when exporting and processing video recordings captured by closed circuit

STANDARDS SUPPORTING SIMULATIONS OF SMART MANUFACTURING SYSTEMS

December 12, 2016
Author(s)
Conrad Bock, Guodong Shao, Kevin W. Lyons, Ronay Ak, KC Morris, Bjoern J. Johansson
Manufacturing standards provide the means for industries to effectively and consistently deploy methodologies and technologies to assess process performance. These assessments set the stage for controlling the manufacturing systems and processes and

STANDARDS BASED GENERATION OF A VIRTUAL FACTORY MODEL

December 11, 2016
Author(s)
Sanjay Jain, David Lechevalier
Development of manufacturing simulation models usually requires experts with knowledge of multiple areas including manufacturing, modeling, and simulation software. The expertise requirements increase for virtual factory models that include representation

Towards Energy Efficiency in Ultra Dense Networks

December 11, 2016
Author(s)
Wei Yu, Hansong Xu, Amirshahram Hematian, David W. Griffith, Nada T. Golmie
The Ultra Dense Network (UDN), as a key enabler for future wireless networks (such as 5G), is comprised of a massive number of small cells in the network. Nonetheless, energy consumption will be non-negligible when a large number of small- cell Base

Vector-Network-Analyzer Calibration Using Line and Multiple Coplanar-Waveguide Offset Reflects

December 9, 2016
Author(s)
Arkadiusz C. Lewandowski, Wojciech Wiatr, Dazhen Gu, Nate Orloff, Thomas Mitchell (Mitch) Wallis, Pavel Kabos
We present the application of our newly developed multi-reflect-thru technique to vector-network-analyzer calibration in the on-wafer environment. This technique uses a set of highly-reflective one-port devices, referred to as offset-reflects, and a single

An ultra-low noise, high-voltage piezo driver

December 8, 2016
Author(s)
Neal C. Pisenti, Alessandro Restelli, Ben J. Reschovsky, Daniel Barker, Gretchen K. Campbell
We present an ultra-low noise, high-voltage driver suited for use with piezoelectric actuators and other low- current applications. The architecture uses a flyback switching regulator to generate up to 250V in our current design, with an output of 1 kV or

Kicking the Tires of the NIST Microwave Uncertainty Framework,

December 8, 2016
Author(s)
Ronald A. Ginley
As with anything new, especially metrology tools, you want to know how good the new tool is. This is generally done through comparisons with existing systems. In this paper such a comparison is described. The new NIST method of processing measurements and

MyData API Patterns: OAuth

December 8, 2016
Author(s)
Martin Burns, David A. Wollman
The My Data initiatives are part of the Administration's efforts to empower Americans with secure access to their own personal data, and to increase citizens' access to private-sector data-based applications and services. With its focus on personal data

Water Dynamics in Rigid Ionomer Networks

December 8, 2016
Author(s)
N. C. Osti, T.N. Etampawala, U.M. Shrestha, D. Aryal, Madhu Sudan Tyagi, S. O. Diallo, E. Mamontov, C. J. Cornelius, D. Perahia
The dynamics of water within ionic polymer networks formed by sulfonated poly(phenylene) (SPP), as revealed by quasi-elastic elastic neutron scattering (QENS), is presented. These polymers are distinguished from other ionic macromolecules by their rigidity

Atomically precise device fabrication

December 7, 2016
Author(s)
Joseph A. Hagmann, Xiqiao Wang, Pradeep N. Namboodiri, Richard M. Silver, Curt A. Richter
An improved capacity to control matter at the atomic scale is central to the advancement of nanotechnology. The complementary metal-oxide-semiconductor (CMOS) devices that power existing computing technology, which continue to scale down in size as
Displaying 14801 - 14825 of 73697
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