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Search Publications

NIST Authors in Bold

Displaying 1426 - 1450 of 2724

Microwave Characterization of Transparent Conducting Films

May 26, 2011
Author(s)
Jan Obrzut, Oleg A. Kirillov
The high frequency conductivity of thin metallic and graphitic nano-films attracts interest due to many potential applications in spin electronics, electromagnetic shielding, flexible antennas, displays, and solar cells. The surface morphology of thin

Electrical Reliability Testing of Single-Walled Carbon Nanotube Networks

May 18, 2011
Author(s)
Mark C. Strus, Ann C. Chiaramonti Debay, Robert R. Keller, Yung J. Jung, Younglae Kim
We present test methods to investigate the electrical reliability of nanoscale lines of highly-aligned, networked, metallic/semiconducting single-walled carbon nanotubes (SWCNTs) fabricated through a template-based fluidic assembly process. We find that

Progress on CD-AFM tip width calibration standards

May 10, 2011
Author(s)
Ronald G. Dixson, Boon Ping Ng, Craig D. McGray, Ndubuisi G. Orji, Jon C. Geist
The National Institute of Standards and Technology (NIST) is developing a new generation of standards for calibration of CD-AFM tip width. These standards, known as single crystal critical dimension reference materials (SCCDRM) have features with near

Dual-wavelength transfer standard for laser peak-power measurement

May 9, 2011
Author(s)
Rodney W. Leonhardt, Daniel King
The National Institute of Standards and Technology (NIST) and the Naval Surface Warfare Center – Corona Division (NSWC) have jointly developed a low-level peak-power radiometer (D-ESR) which functions as a transfer standard for measuring laser pulses at

Grain Moisture Meter Test Methods and Tolerances

May 2, 2011
Author(s)
Gloria D. Lee
Due to the significant economic impact of each grain moisture meter and the importance of applying correct test methods and tolerances, this article has been written to answer recent inquires regarding using the two test methods in NIST Handbook 44

Evaluation of Bias for Two Charpy Impact Machines Using the Same Instrumented Striker

May 1, 2011
Author(s)
Christopher N. McCowan, Enrico Lucon, Raymond L. Santoyo
Two Charpy machines were used to test NIST verification specimens at three energy levels: low energy (≈ 15 J at -40°C), high energy (≈ 100 J at -40°C) and super-high energy (≈ 240 J at room temperature). The study evaluates the differences observed for the

NIST Handbook 133: Checking the Net Contents of Packaged Goods (2011 Ed.)

April 27, 2011
Author(s)
Kenneth S. Butcher, Linda D. Crown, David Sefcik, Lisa Warfield
This handbook has been prepared as a procedural guide for the compliance testing of net contents statements on packaged goods. Compliance testing of packaged goods is the determination of the conformance results of the packaging, distribution, and

TSOM Method for Semiconductor Metrology

April 18, 2011
Author(s)
Ravikiran Attota, Ronald G. Dixson, John A. Kramar, James E. Potzick, Andras Vladar, Benjamin D. Bunday, Erik Novak, Andrew C. Rudack
Through-focus scanning optical microscopy (TSOM) is a new metrology method that achieves 3D nanoscale measurement resolution using conventional optical microscopes; measurement sensitivities are comparable to what is typical using Scatterometry, SEM and

Photoemission Threshold Spectroscopy: MOS Band alignments

April 7, 2011
Author(s)
Nhan V. Nguyen
In this talk I will 1) briefly review SED’s history of the optical thin metrology project, 2) describe the principle of internal photoemission (IPE) and the applications to determine the band alignments of metal-oxide-semiconductor structures, and 3)

SHREC11 Track: Shape Retrieval on Non-rigid 3D Watertight Meshes

April 7, 2011
Author(s)
Zhouhui Lian, Afzal A. Godil
Non-rigid 3D shape retrieval has become an important research topic in content-based 3D object retrieval. The aim of this track is to measure and compare the performance of non-rigid 3D shape retrieval methods implemented by different participants around

Research Directions in Security Metrics

April 4, 2011
Author(s)
Wayne Jansen
More than 100 years ago, Lord Kelvin observed that measurement is vital to deep knowledge and understanding in physical science. During the last few decades, researchers have made various attempts to develop measures and systems of measurement for computer

Measuring Step Gauges Using the NIST M48 CMM

April 1, 2011
Author(s)
John R. Stoup, Bryon S. Faust
The Moore M48 coordinate measuring machine (CMM) has provided NIST with flexible measurement capabilities for many years. The machine’s state of the art performance was further improved following the move of the machine into the new Advanced Measurement

Primary Calibration of Accelerometers by Optical Methods, NIST and USAF

April 1, 2011
Author(s)
Beverly F. Payne, Jerry Steffen
This paper describes ongoing efforts to provide high quality calibration of accelerometers by NIST for military and civilian labs. Traditionally the approach is the calibration of reference accelerometers by NIST for labs requiring calibrations with the

Influence of Periodic Patterning on the Magnetization Response of Micromagnetic Structures

March 29, 2011
Author(s)
SangHyun S. Lim, Thomas M. Wallis, Atif A. Imtiaz, Dazhen Gu, Thomas Cecil, Pavel Kabos, Pavol Krivoski
The magnetization dynamics of a single, patterned, thin-film Permalloy (Ni80Fe20, Py) elements embedded in a coplanar waveguide (CPW) are investigated. The anisotropic magnetoresistance (AMR) effect serves as the detection mechanism in current-modulated

Neutron Imaging of Lithium Concentration in Battery Pouch Cells

March 23, 2011
Author(s)
Daniel S. Hussey, David L. Jacobson, Jason B. Siegel, C. D. Stefan, Xinfan Lin, David Gorsich
This paper shows how neutron radiography can be used for in situ quantification of the lithium concentration across battery electrodes, a critical physical system state. The change in lithium concentration between the charged and discharged states of the

Comparison of 4.5 kV SiC JBS and Si PiN Diodes for 4.5 kV Si IGBT Anti-parallel Diode Applications

March 10, 2011
Author(s)
Tam H. Duong, Allen R. Hefner Jr., Karl Hobart, Sei-Hyung Ryu, David Grider, David W. Berning, Jose M. Ortiz, Eugene Imhoff, Jerry Sherbondy
A new 60 A, 4.5 kV SiC JBS diode is presented and its performance is compared to Si PiN diodes used as the anti-parallel diode for 4.5 kV Si IGBTs. The current-voltage, capacitance-voltage, reverse recovery, and reverse leakage characteristics of both

Measurement Traceability and Quality Assurance in a Nanomanufacturing Environment

March 8, 2011
Author(s)
Ndubuisi G. Orji, Ronald G. Dixson, Aaron Cordes, Benjamin Bunday, John Allgair
A key requirement for nano-manufacturing is maintaining acceptable traceability of measurements performed to determine size. Given that properties and functionality at the nanoscale are governed by absolute size, maintaining the traceability of dimensional
Displaying 1426 - 1450 of 2724
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