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NIST Authors in Bold

Displaying 1276 - 1300 of 2189

Accuracy Considerations for Critical Dimension Semiconductor Metrology

September 9, 2008
Author(s)
Ronald G. Dixson, Ndubuisi G. Orji, B Bunday, J Allgair
As the size of integrated circuit features continues to decrease, the accuracy of measurements becomes more important. Due to greater emphasis on precision rather than accuracy, many of the measurements made in semiconductor fabs are not traceable to the

NIST Microform Calibration System for Rockwell Hardness Standardization

August 25, 2008
Author(s)
Jun-Feng Song, Samuel R. Low III, Xiaoyu A. Zheng
In the uncertainty budget of Rockwell hardness tests, microform geometric errors of the diamond indenter are a major contributor. The microform calibration of Rockwell diamond indenters has been one of the key steps for Rockwell hardness standardization

Performance of Super-Resolution Enhancement for Flash LADAR Data

August 21, 2008
Author(s)
Tsai Hong Hong, Shuowen Hu, S. S. Young
Flash laser detection and ranging (LADAR) systems are increasingly used in robotics applications for autonomous navigation and obstacle avoidance. Their compact size, high frame rate, wide field of view, and low cost are key advantages over traditional

Cellulose Nanocrystals the Next Big Nano-thing?

August 6, 2008
Author(s)
Michael T. Postek, Andras Vladar, John A. Dagata, Natalia Farkas, Bin Ming, Ronald Sabo, Theodore H. Wegner
Biomass surrounds us from the smallest alga to the largest redwood tree. Even the largest trees owe their strength to a newly-appreciated class of nanomaterials known as cellulose nanocrystals (CNC). Cellulose, the world s most abundant natural, renewable

Metrology at the Nanoscale: What are the Grand Challenges?

August 6, 2008
Author(s)
Kevin W. Lyons, Michael T. Postek
Nanometrology provides the means to measure and characterize nanometer scale process and product performance and covers an expanse of topics including instrumentation, measurement methods (off-line and in-process applications), and standards. To meet the

Natural Gas Flow Calibration Service

August 1, 2008
Author(s)
Aaron N. Johnson
This document describes NIST's high pressure natural gas flow calibration service (NGFCS). Flow calibrations are conducted offsite at the Colorado Experimental Engineering Station Incorporated (CEESI) in Garner, Iowa. A parallel array of nine turbine meter

Simulated SEM Images for Resolution Measurement

July 30, 2008
Author(s)
Petr Cizmar, Andras Vladar, Bin Ming, Michael T. Postek
Resolution is a key performance metric, which often defines the quality of a scanning electron microscope (SEM). Traditionally, there is the subjective measurement of the distance between two points on special ''resolution'' samples and there are several

REPRESENTING LAYOUT INFORMATION IN THE CMSD SPECIFICATION

July 9, 2008
Author(s)
Frank H. Riddick, Yung-Tsun T. Lee
Developing mechanisms for the efficient exchange of information between simulations and other manufacturing tools is a critical problem today. For many areas of manufacturing, neither representations for the information nor mechanisms for exchanging the

Topography Measurements for Determining the Decay Factors in Surface Replication

July 4, 2008
Author(s)
Jun-Feng Song, P Rubert, Xiaoyu A. Zheng, Theodore V. Vorburger
The electro-forming technique is used at National Institute of Standards and Technology (NIST) for the production of standard reference material (SRM) 2461 standard casings to support nationwide ballistics measurement traceability and measurement quality

Sustaining Engineering Informatics: Toward Methods and Metrics for Digital Curation

July 1, 2008
Author(s)
Joshua Lubell, Sudarsan Rachuri, Eswaran Subrahmanian, Mahesh Mani
Ensuring the long-term usability of engineering informatics (EI) artifacts is a challenge, particularly for products with longer life cycles than the computing hardware and software used for their design and manufacture. Addressing this challenge requires

A Real World Pilot implementation of the Core Manufacturing Simulation Information Model

June 23, 2008
Author(s)
Swee K. Leong, Marcus Johansson, Bj?rn Johansson, Yung-Tsun T. Lee, Frank H. Riddick
While software for discrete event simulation (DES) has emerged into sophisticated tools for decision support in a wide range of contexts, the need to integrate DES tools with other applications is increasing. In the industrial engineering context

Modeling and Simulation for Sustainable Manufacturing

June 11, 2008
Author(s)
Deogratias Kibira, Charles R. McLean
With increasing frequency the news media reports that the planet is warming, pollutants are contaminating the environment, energy costs are rising, and precious natural resources are dwindling. These reports are sounding an alarm that we need to change the

An Ontological Modeling Platform

June 4, 2008
Author(s)
V.C. Liang, Conrad E. Bock, XuanFang Zha
The Ontological Modeling Platform described in this paper is a class library for extended ontological operations, to support extension of ontology languages, composition of interconnected elements, and high-level product modeling services, such as

Reducing Thermal Noise in Molecular Force Spectroscopy

June 2, 2008
Author(s)
Gordon A. Shaw
Molecular force spectroscopy is the practice of testing the mechanical properties of single molecules. The precision determination of these properties requires an instrument capable of piconewton-level force measurement. The atomic force microscope (AFM)

Design And Fabrication Of MJTCs On Quartz Substrates At NIST

June 1, 2008
Author(s)
Thomas E. Lipe Jr., Joseph R. Kinard Jr., Luciana Scarioni
Wet and dry etching are employed in the fabrication of new planar, thin-film multijunction thermal converters (MJTCs) on quartz membranes and crystalline quartz chips at NIST. The use of crystalline quartz as a material for the membrane and for the chip

Towards a Multi-View Semantic Model for Product Feature Description

May 28, 2008
Author(s)
Patrick Hoffmann, Shaw C. Feng, Gaurav Ameta, Parisa Ghodous, Lihong Qiao
Multiple perspectives need to be included in a product development process. Engineers from different departments usually have different views on a product design. It is hence necessary to define information structures that support multiple views. We

ER Simulation Prototypes for Incident Management Training

May 19, 2008
Author(s)
Guodong Shao, Charles R. McLean
First responders and incident management personnel need better training resources to prepare for future disasters. Live training exercises while valuable are often very expensive to organize and conduct. Training using modeling, simulation, and gaming

Relating Taxonomies with Regulations

May 13, 2008
Author(s)
Chin P. Cheng, Jiayi Pan, Gloria T. Lau, Kincho H. Law, Albert T. Jones
Increasingly, taxonomies are being developed for a wide variety of industrial domains and specific applications within those domains. These taxonomies attempt to represent formally the vocabularies commonly used by domain practitioners. These formal

Gauge Blocks - A Zombie Technology

May 1, 2008
Author(s)
Theodore D. Doiron
Gauge blocks have been the primary method for disseminating length traceability for over 100 years. Their longevity was based on two things: it was relatively inexpensive to deliver very high accuracy to users, and the technical limitation that the range

Mode-selective acoustic spectroscopy of trigonal piezoelectric crystals

May 1, 2008
Author(s)
Ward L. Johnson, Carlos F. Martino, Sudook A. Kim, Paul R. Heyliger
A noncontacting electromagnetic-acoustic-resonance technique is presented for generating and detecting vibrational modes with prescribed symmetries in piezoelectric trigonal crystals with cylindrical geometry. This technique provides the experimental basis

PIE: An Online Prediction System for Protein-Protein Interactions from Text

April 17, 2008
Author(s)
Sun Kim, Soo-Yong Shin, In-Hee Lee, Soo-Jin Kim, Ram D. Sriram, Byoung-Tak Zhang
bio-text mining area, since the PPI information is critical for understanding biological processes. However, there are very few open systems available on the Web and most of the systems focus on keyword searching based on prede¯ned PPIs. PIE (Protein
Displaying 1276 - 1300 of 2189
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