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Search Publications

NIST Authors in Bold

Displaying 726 - 750 of 1580

Polymer-derived SiCN composites with magnetic properties

November 1, 2003
Author(s)
Atanu Saha, Sandeep R. Shah, Rishi Raj, Stephen E. Russek
Composites consisting of particles of α-iron dispersed in silicon carbonitride (SiCN) were fabricated by a polymer route. The composites had iron inclusions with the same magnetization as bulk iron, but they resisted oxidation up to 500°C and had a

IEEE Standard 802.16 for Global Broadband Wireless Access

October 21, 2003
Author(s)
Roger Marks
Global standardization is a key issue for the success of broadband wireless access systems. The IEEE 802.16 Working Group on Broadband Wireless Access, with hundreds of participants worldwide, has developed IEEE Standard 802.16, with its WirelessMAN air

Phase-Dependent RCS Measurements in the Presence of Outliers

October 19, 2003
Author(s)
Lorant A. Muth, Timothy Conn
Coherent radar cross section measurements on a target moving along the line-of-sight in free space will trace a circle centered on the origin of the complex (I,Q) plane. The presence of additional complex signals (for example, background, clutter, average

Uncertainty Analysis for Spherical Near-Field Measurement

October 19, 2003
Author(s)
Michael H. Francis, Ronald C. Wittmann
A general approach is introduced for estimating uncertainties in far-field paramenters from spherical near-field measurements. Although the analysis is incomplete at present, we expect that as the measurement radius increases, our results will transform

Uncertainty Analysis of RCS Calibrations at the Etcheron Valley Range

October 19, 2003
Author(s)
Lorant A. Muth, Dale M. Diamond, John Liles, James Adams
We have been developing the uncertainty analysis of RCS calibrations and measurements at the Etcheron Valley RCS outdoor ground-bounce facility in the 2-18 GHz range. In this study we report on the results of the uncertainty analysis primarily at 11.3 GHz

RF and IF mixer optimum matching impedances extracted by large-signal vectorial measurements

October 7, 2003
Author(s)
Alessandro Cidronali, Giovanni Loglio, Jeffrey Jargon, Kate Remley, I. Magrini, Donald C. DeGroot, Dominique Schreurs, Kuldip Gupta, Gianfranco Manes
This paper introduces a new technique that allows us to measure the admittance conversion matrix of a two-port device, using a Nonlinear Vector Network Analyzer. This method is applied to extract the conversion matrix of a 0.2 micron pHEMT, driven by a 4.8

RF Behavioural Modelling from Multisine Measurements: Influence of Excitation Type

October 7, 2003
Author(s)
Dominique Schreurs, M. Myslinski, Catherine A. Remley
Behavioural models for RF devices are typically based on large-signal RF measurements. Until now, those measurements were usually limited to single-tone excitations. In this work, we focus on the use of multisines in the experiment design, and, more

Averaged Transition Conditions for Electromagnetic Fields at a Metafilm

October 1, 2003
Author(s)
Edward Kuester, Mohamed Mohamed, Christopher L. Holloway, Melinda Picket-May
This work derives generalized sheettransition conditions (GSTCs) for the average electromagnetic fields across a surface distribution of electrically small scatterers characterized by electric and magnetic polarization densities. We cann such an

High-Frequency Characteristics of Metal/Native-Oxide Multilayers

September 5, 2003
Author(s)
Geoffrey S. Beach, Thomas J. Silva, F. T. Parker, A. E. Berkowitz
The high-frequency magnetization dynamics of magnetically soft Co χFe 100-χ metal/native-oxide multilayers were studied as a function of alloy composition (10 less than or equal to} χ less than or equal to} 50) using a time-domain inductive technique. The

Induced Currents on an EUT in a Free-Space and a Modified TEM Cell Environment

August 19, 2003
Author(s)
Per E. Fornberg, Christopher L. Holloway, Perry F. Wilson
The finite-difference time-domain method is used to investigate whether the currents induced on an equipment under test (EUT) in a TEM cell are similar to those induced in an ideal free-space environment. The approach is to simulate an identical EUT in

Assessing A Loaded Reverberation Chamber: Calculating Threshold Metrics

August 18, 2003
Author(s)
Christopher L. Holloway, David A. Hill, John M. Ladbury, Todd M. Lammers
In this paper we present an expression for two threshold metrics of a loaded reverberation chamber. One metric is based on the chamber quality factor (Q) and the other is based on a useable volume of a loaded reverberation chamber. These metrics are

Total Radiated Power Limits for Emission Measurements in a Reverberation Chamber

August 18, 2003
Author(s)
Christopher L. Holloway, Perry F. Wilson, Galen H. Koepke, Marco Candidi
In this paper we present a total radiated power limit for emission measurements in reverberation chambers. This total radiation power limit is intended to be equivalent to the FCC maximum E-field limit for emission testing over a ground plane.

EMC Research at NIST, Boulder

July 11, 2003
Author(s)
Perry F. Wilson, Christopher L. Holloway, Galen H. Koepke, John M. Ladbury, Arthur Ondrejka, Robert T. Johnk, Keith D. Masterson, Dennis G. Camell
N/A

Different Dynamic and Static Magnetic Anisotropy in Thin Permalloy Films

July 6, 2003
Author(s)
Radek Lopusnik, John P. Nibarger, Thomas J. Silva, Zbigniew J. Celinski
The values of uniaxial anisotropy Hk in thin polycrystalline Permalloy films measured by static and dynamic methods differ by as much as a factor 1.5. The anisotropy obtained with a pulsed inductive microwave magnetometer in 2.5-100 nm thick Permalloy

High-frequency noise measurements in spin-valve Devices

July 1, 2003
Author(s)
N. A. Stutzke, S. L. Burkett, Stephen E. Russek
High-frequency magnetic noise in magnetoresistive devices being developed for read-sensor and magnetic random access memory applications may present fundamental limitations on the performance of sub-micrometer magnetic devices. High- frequency magnetic

In-situ conductance characterization of Fe/Ag multilayer contacts on GaAs

July 1, 2003
Author(s)
Dustin Hite, Stephen E. Russek, David P. Pappas
Electrical transport characteristics for epitaxially grown Ag/Fe/Ag multilayers on GaAs(100) and GaAs(110) have been studied under various growth conditions. The surfaces and structure of the multilayer were characterized by low energy electron diffraction
Displaying 726 - 750 of 1580
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