The impact of internal sampling circuitry on the phase error of the nose-to-nose oscilloscope calibration

Published

August 1, 2003

Author(s)

Catherine A. Remley

Abstract

We study the dependence of the phase error in the nose-to-nose oscilloscope calibration on the oscilloscope's internal sampling circuitry. We first develop a robust sampling-circuit model for use in numerical simulations of the nose-to-nose derived estimate of the sampler's impulse response with the true impulse response of the sampler. Through parametric study, we ascertain which components of the internal sampling circuitry contribute mose significantly to the phase error in the noise-to-nose-derived impulse response estimate. We use the results of our parametric studies to predict an expected range of phase errors from a range of realistic component values.

Citation

Technical Note (NIST TN) - 1528

Report Number

1528

NIST Pub Series

Technical Note (NIST TN)

Pub Type

NIST Pubs

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Keywords

calibration, nonlinear vector network analyzer, nose-to-nose calibration, oscilloscope calibration, phase calibration, sampling circuit, SPICE simulations

Citation

Remley, C. (2003), The impact of internal sampling circuitry on the phase error of the nose-to-nose oscilloscope calibration, Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=30875 (Accessed October 8, 2025)