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Reversible axial-strain effect and extended strain limits in Y-Ba-Cu-O coatings on deformation-textured substrates

Published

Author(s)

Najib Cheggour, John (Jack) W. Ekin, Cameron C. Clickner, D. T. Verebelyi, C. L. H. Thieme, Ron Feenstra, P Goyal

Abstract

The dependence of transport critical-current density (Jc) on axial tensile strain (ε) was measured at 76 K and self-magnetic field for YBa2Cu3O7-δ (YBCO) coatings on buffered, deformation-textured substrates of pure Ni, Ni-5at.%-W, and Ni-10-at.%Cr-2-at.%-W. Expectations have been that the strain tolerance of these composites would be limited by the relatively low yield strains of the deformation-textured substrates, typically less than 0.2 %. However, results show that the irreversible degradation of Jcε occurs at a strain equal to about twice the yield strain of the substrate. Therefore, YBCO/Ni-alloy composites may satisfy axial-strain performance requirements for electric devices, including the most demanding applications, motors and generators in which a strain tolerance exceeding 0.25 % is needed. Furthermore, the YBCO/Ni-5-at.%-W conductors showed a reversible strain effect, which may be induced by a reversible strain-field broadening around mismatch dislocations at the grain boundaries. This effect may contribute to the unexpectedly large usable strain range of these conductors.
Citation
Applied Physics Letters
Volume
83
Issue
20

Keywords

coated conductors, critical current density, elastic strain, mechanical properties, microstructure, reversibility, strain, stress, superconductors

Citation

Cheggour, N. , Ekin, J. , Clickner, C. , Verebelyi, D. , Thieme, C. , Feenstra, R. and Goyal, P. (2003), Reversible axial-strain effect and extended strain limits in Y-Ba-Cu-O coatings on deformation-textured substrates, Applied Physics Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31416 (Accessed October 14, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created November 16, 2003, Updated October 12, 2021