Juroshek, J.
and LeGolvan, D.
(2003),
Correcting For Systematic Errors In One-Port Calibration-Standards, ARFTG Microwave Measurement Conference, Boulder, CO, USA
(Accessed June 6, 2023)
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Correcting For Systematic Errors In One-Port Calibration-Standards
Published
Author(s)
,
Abstract
This paper describes how to correct for systematic errors in one-port vector network analyzer calibrations that are caused by modeling errors in the one-port calibration standards. The paper shows how to correct an open-short-load calibration that was made with an broadband load whose reflection coefficient is not zero. The method can also be used to correct for modeling errors in the open and short reflects if those errors are known. The method is demonstrated by performing an open-short-load calibration with a broadband load whose reflection coefficient is as large as 0.035 at 50 GHz, and then correcting that calibration to produce measurement accuracies comparable to a thru-reflect-line calibration.Proceedings Title
ARFTG Microwave Measurement Conference
Conference Dates
December 2-5, 2003
Conference Location
Boulder, CO, USA
Pub Type
Conferences
Keywords
microwave measurements, reflection coefficient, vector network analyzer, scattering parameters, vector error correction, open short load calibrations, thru reflect line calibrations, one port measurements
Citation
Created December 4, 2003, Updated October 12, 2021