Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 57001 - 57025 of 74461

The NIST Real-time Control System (RCS) An Applications Survey

March 1, 1995
Author(s)
James S. Albus
The Real-time Control System (RCS) architecture developed at NIST and elsewhere over the past two decades [1] defines a canonical form for a nested intelligent control system. The RCS architecture consists of a hierarchically layered set of processing

Domain effects in Faraday effect sensors based on iron garnets

February 1, 1995
Author(s)
M. N. Deeter
Domain-induced diffraction effects produced by two iron garnet thick films and two bulk crystals are compared. The thick films, characterized by a serpentine magnetic domain structure, produced nonlinear response functions; this is in qualitative agreement

Fire Performance of an Interstitial Space Construction System (NISTIR 5560)

February 1, 1995
Author(s)
James R. Lawson, E Braun, Laurean A. DeLauter, G Roadarmel
An interstitial space building construction assembly, consisting of a walk-on deck suspended from above by structural steel which also supported a functional floor, reproduce a design planned for use in a new hospital complex at Elmendorf Air Force Base

Interim testing artifact (ITA) : a performance evaluation system for coordinate measuring machines (CMMs) : user manual

February 1, 1995
Author(s)
Amy Singer, J Land, Steven D. Phillips, Daniel Sawyer, Bruce R. Borchardt, Gregory W. Caskey, D Ward, P Snoots, B Faust
The Interim Testing Artifact (ITA) is designed to quickly test CMMs for performance problems so that they can be repaired before significant numbers of good parts are erroneously rejected (or bad parts accepted) by the CMM. Frequent testing using the ITA

LRM Probe-Tip Calibrations Using Nonideal Standards

February 1, 1995
Author(s)
Dylan F. Williams, Roger Marks
The line-reflect-match calibration is enhanced to accommodate imperfect match standards and lossy lines typical of monolithic microwave integrated circuits. We characterize the match and line standards using an additional line standard of moderate length
Displaying 57001 - 57025 of 74461
Was this page helpful?