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Search Publications

NIST Authors in Bold

Displaying 56651 - 56675 of 74214

Assessing Halon Alternatives for Aircraft Engine Nacelle Fire Suppression.

May 1, 1995
Author(s)
William L. Grosshandler, Cary Presser, Daniel L. Lowe, William J. Rinkinen
A coaxial turbulent spray burner was built to evaluate the relative effectiveness of different chemicals for suppressing fires in a jet engine nacelle. The fire suppressant of current choice, halon 1301 (CF3Br), must be replaced because of its detrimental

Compositional Analysis of Beneficiated Fly Ashes.

May 1, 1995
Author(s)
Paul E. Stutzman, R L. Centeno
Understanding the material properties of mineral admixtures will help in providing a better understanding of the factors that control their performance in concrete. This study, a part of an effort by that includes reaction kinetics, microstructure

Computer Analysis of Wall Constructions in the Moisture Control Handbook.

May 1, 1995
Author(s)
D M. Burch, C A. Saunders
A computer model, called MOIST, is used to investigate the moisture performance of recommended wall constructions given in the Moisture Control Handbook (1991). These wall constructions are intended to minimize moisture accumulation, thereby preventing

Display-Measurement Round-Robin

May 1, 1995
Author(s)
D. J. Bechis, M. D. Grote, D. P. Bortfeld, L. H. Hammer, M. J. Polak, Edward F. Kelley, George R. Jones Jr., Paul A. Boynton

Metrology with the Ultraviolet Scanning Transmission Microscope

May 1, 1995
Author(s)
Richard M. Silver, James E. Potzick, Y Hu
A novel design for an ultraviolet critical dimension measurement transmission microscope utilizing the Stewart platform as the rigid main structure has been implemented. This new design shows improved vibration characteristics and is able to accommodate

Microwave Characterization of Flip-Chip MMIC Components

May 1, 1995
Author(s)
Roger Marks, Jeffrey A. Jargon, C. K. Pao, C. P. Wen, Y. C. Shih
Abstract: We apply custom calibration standards and software to the accurate on-wafer measurement of MIM capacitors and spiral inductors on flip-chip coplanar-waveguide MMICs. We suggest equiva1lent cir­cuit models and document their deficiencies. The

Microwave Characterization of Flip-Chip MMIC Interconnections

May 1, 1995
Author(s)
Roger Marks, Jeffrey A. Jargon, C. K. Pao, C. P. Wen
Abstract: We report accurate on-wafer measurements of transmission lines on flip-chip coplanar-waveguide MMICs. The effects are difficult to predict theoretically, and, without custom standards and unique calibration software, measurements would be

Overlay Measurements and Standards

May 1, 1995
Author(s)
Richard M. Silver, James E. Potzick, Robert D. Larrabee
The relative misalignment of features produced by different mask levels (i.e., overlay error) is projected to become an increasingly important problem to the semiconductor industry as the size of the critical features continues to decrease. In response to

Probabilistic computation of Poiseuille flow velocity fields

May 1, 1995
Author(s)
Fern Y. Hunt, J. F. Douglas, Javier Bernal
Velocity fields for Poiseuille flow through tubes having general cross section are calculated using a path integral method involving the first‐passage times of random walks in the interior of the cross sectional domain D of the pipe. This method is applied

Re-Evaluation of the Accuracy of NIST Photomask Linewidth Standards

May 1, 1995
Author(s)
James E. Potzick
Every artifact measurement standard has some uncertainty associated with its calibration, and the NIST Photomask Linewidth Standards are no exception. This uncertainty is caused by a combination of those factors which influence the calibration measurement
Displaying 56651 - 56675 of 74214
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