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Application of Single Electron Tunneling: Precision Capacitance Ratio Measurements

Published

Author(s)

Alan F. Clark, Neil M. Zimmerman, Edwin R. Williams, A. Amar, D. Song, F. C. Wellstood, C. J. Lobb, Robert J. Soulen
Citation
Applied Physics Letters
Issue
19

Citation

Clark, A. , Zimmerman, N. , Williams, E. , Amar, A. , Song, D. , Wellstood, F. , Lobb, C. and Soulen, R. (1995), Application of Single Electron Tunneling: Precision Capacitance Ratio Measurements, Applied Physics Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=19521 (Accessed April 24, 2024)
Created April 30, 1995, Updated October 12, 2021