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PUBLICATIONS

Application of Single Electron Tunneling: Precision Capacitance Ratio Measurements

Published

Author(s)

Alan F. Clark, Neil M. Zimmerman, Edwin R. Williams, A. Amar, D. Song, F. C. Wellstood, C. J. Lobb, Robert J. Soulen
Citation
Applied Physics Letters
Issue
19
Pub Type
Journals

Download Paper

Local Download
Electrical / electromagnetic metrology

Citation

Clark, A. , Zimmerman, N. , Williams, E. , Amar, A. , Song, D. , Wellstood, F. , Lobb, C. and Soulen, R. (1995), Application of Single Electron Tunneling: Precision Capacitance Ratio Measurements, Applied Physics Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=19521 (Accessed December 13, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created April 30, 1995, Updated October 12, 2021