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Displaying 55626 - 55650 of 74203

Migration Plan for Product Data Standards

February 1, 1996
Author(s)
Mary Mitchell, William Gruttke
A significant benefit of using standards is that standards ease the migration from one computing environment to another. But what happens when the migration if from one standard to another? The organization that led the creation of both has committed to

Novel Active-Vision-Based Motion Cues for Local Navigation

February 1, 1996
Author(s)
S R. Kundur, Daniel Raviv
In the absence of a-priori information about the environment, an autonomous mobile robot relies on sensory information to make local judgments about its surrounding. Generation of a local collision-free path based on sensory data plays an important role in

Santa Ana Fire Department Experiments at South Bristol Street (NISTIR 5776)

February 1, 1996
Author(s)
William D. Walton, Anthony D. Putorti Jr., W H. Twilley, John Albers
A series of fire experiments were conducted in vacant single family dwellings on South Bristol Street in Santa Ana, California. Fire experiments were conducted in bedrooms and living rooms. Fuels consisted of either home furnishings or a propane burner

Simplified Design Procedure for Hybrid Precast Concrete Connections

February 1, 1996
Author(s)
Geraldine S. Cheok, William C. Stone, S. D. Nakaki
A rational design procedure is presented to compute the probable moment, the nominal moment, and the story drift capacities of a hybrid precast moment-resisting beam-to-column connection. The hybrid connections consist of mild steel which is used to

A critical evalution of thermal mass flow meters

January 5, 1996
Author(s)
S A. Tison
Many semiconductor processes require that stable and known flows of gas be delivered to the processing chamber. The thermal mass flow meter (TMFM) is used almost exclusively in the semiconductor industry for the admission of process gases. While TMFM’s have

A Closed Loop Controller for Electron-beam Evaporators

January 1, 1996
Author(s)
Alan H. Band, Joseph A. Stroscio
A simple instrument for automatically controlling the deposition rate of an electronbeam evaporator is described. The design incorporates a commercially available, microprocessor based, Proportional-Integral-Differential (PID) process controller which
Displaying 55626 - 55650 of 74203
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