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A Beam Line for Highly Charged Ions Extracted from the NIST EBIT

Published

Author(s)

William D. Phillips
Citation
Review of Scientific Instruments
Volume
67

Citation

Phillips, W. (1996), A Beam Line for Highly Charged Ions Extracted from the NIST EBIT, Review of Scientific Instruments (Accessed April 18, 2024)
Created January 1, 1996, Updated February 17, 2017