Phillips, W.
(1996),
A Beam Line for Highly Charged Ions Extracted from the NIST EBIT, Review of Scientific Instruments
(Accessed June 10, 2023)
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A Beam Line for Highly Charged Ions Extracted from the NIST EBIT
Published
Author(s)
Citation
Review of Scientific Instruments
Volume
67
Pub Type
Journals
Citation
Created January 1, 1996, Updated February 17, 2017