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Displaying 52426 - 52450 of 74036

Measurement of the He Ground State Lamb Shift Via the Two-Photon 1 1 S - 2 1 S transition

April 1, 1998
Author(s)
S Bergeson, A Balakrishnan, K G. Baldwin, Thomas B. Lucatorto, J P. Marangos, T J. McIlrath, Thomas R. O'Brian, S L. Rolston, J Wen, N Westbrook, C H. Cheng, E E. Eyler, Craig J. Sansonetti
We have extended two-photon Doppler-free spectroscopy to the vacuum ultraviolet spectral region to accurately measure the He 1 1S - 2 1S transition at 120 nm. Our result is 4 984 872 315[48] MHz. This yields a ground state Lamb shift of 41104[48] MHz, in

Molecular Dynamics Simulation of Tethered Chains

April 1, 1998
Author(s)
Raymond D. Mountain, Joseph B. Hubbard
A description is provided for a molecular dynamics code that simulates the dynamics of long chain molecules tethered to a smooth surface. The operation of the code is discussed from the point of view of the user. The structure of the input files is

NIST Calibration Service for Capacitance Standards at Low Frequencies

April 1, 1998
Author(s)
Yui-May Chang, Summerfield B. Tillett
This document describes the capacitance calibration service provided by NIST, including measurement procedures and systems used to calibrate capacitance standards of nominal values in the range of 0.001 pF to 1 F, at frequencies up to 10 kHz. Discussed are

Preparation and Characterization of Polymer/Dendrimer Blends Progress Report 3/31/98

April 1, 1998
Author(s)
Eric J. Amis, Barry J. Bauer, A Topp, T J. Prosa, Da-Wei Liu, C L. Jackson, Alamgir Karim, B D. Ermi, K A. Barnes, A Nakatani, G Nisato, R Ivkov
Dendrimer and dendrigraft solutions, blends, and interpenetrating polymer networks are characterized by small angle neutron and x-ray scattering, reflectivity, and transmission electron microscopy.

RTP Calibration Wafer Using Thin-Film Thermocouples

April 1, 1998
Author(s)
Kenneth G. Kreider, D P. DeWitt, Benjamin K. Tsai, Francis J. Lovas, David W. Allen
Rapid thermal processing (RTP) is a key technology for the cluster tool, single wafer manufacturing approach that is used to produce integrated circuits at lower cost with reduced line widths and thermal budgets. However, various problems associated with

Summary Report of NIST/MSC Workshop on Traceability in Length

April 1, 1998
Author(s)
Dennis A. Swyt
The National Institute of Standards and Technology, in conjunction with the Measurement Science Conference, conducted an industry-needs workshop on February 4, 1998, on issues with U.S. manufacturing companies, particularly smaller ones, may have in

The EFFective Manager Tool for Software Developers

April 1, 1998
Author(s)
D Wallace, M L. Zimmerman
The collection and analysis of software error, fault, and failure data from many high integrity systems may yield reference data for matching development and assurance methods to characteristics of a specific system. Profiles derived from the data may help

Thermal-Response Time of Superconducting Transition-Edge Microcalorimeters

April 1, 1998
Author(s)
Kent D. Irwin, Gene C. Hilton, David A. Wollman, John M. Martinis
We investigate limits on the thermal-response time of supercondcuting transition-edge microcalorimeters. For operation at 0.1 K, we show that the lower limit on the response time of a superconducting transition-edge microcalorimeter is of order 1 5m due to

USAXS Studies of Silica Fume Additives in Cements and Concrete

April 1, 1998
Author(s)
Andrew J. Allen, Richard A. Livingston
Supplementary cementitious materials like silica fume, which are added to the cement mix and react with calcium ions in the pore solution, enhance the production of calcium-silicate-hydrate gel and modify the microstructure in other ways. By combining

Wavelengths and Oscillator Strengths for Space Astronomy

April 1, 1998
Author(s)
Craig J. Sansonetti, Joseph Reader
Over a period of more than a decade the Atomic Spectroscopy Group at NIST has carried out laboratory research to support the observing program of the Hubble Space Telescope (HST). Our Initial effort concerned the wavelength calibration of GHRS by means of

X-Ray Diffraction Topography of Sapphire for Windows and Domes

March 30, 1998
Author(s)
David R. Black
X-ray diffraction topography has been used as a nondestructive characterization tool to investigate single-crystal sapphire for window and dome applications. A variety of examples are shown that demonstrate the utility of x-ray diffraction imaging as a
Displaying 52426 - 52450 of 74036
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