Skip to main content

NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 52401 - 52425 of 73697

A Simplified Ultrasonic Immersion Technique for Materials Evaluation

January 1, 1998
Author(s)
D Xiang, Nelson N. Hsu, Gerald V. Blessing
A simplified ultrasonic immersion technique has been developed to measure leaky surface and bulk waves in solid materials by using specially designed lensless, line focus polyvinylidene fluoride (PVDF) transducers with a large aperture and a short focal

A Simulation-Based BRP Support System for Supply Chain Management

January 1, 1998
Author(s)
Shigeki Umeda, Albert W. Jones
Modern manufacturing enterprises must collaborate with a large number of suppliers to design and produce their products. Management of these supply chains is crucial. This paper proposes a simulation-based supply chain management system, which supports the

Absolute Silicon Photodiodes for 160 nm to 254 nm Photons

January 1, 1998
Author(s)
L R. Canfield, Robert E. Vest, R Korde, H Schmidtke, R Desor
Silicon n-on-p photodiodes with 100% internal efficiency have been studied in the 160 nm to 254 nm range. Preliminary values for the quantum yield of silicon, a fundamantal property, are determined. Using these values, a trap detector for absolute flux

Active Cavity Radiometer Based on High-TC Superconductors

January 1, 1998
Author(s)
Joseph P. Rice, Raju V. Datla, Leila R. Vale, David A. Rudman, M L. Sing, D Robbes
To implement the detector-based radiometric scale in the new Medium Background infrared [MBIR] facility at the National Institute of Standards and Technology [NIST], we have developed an electrical substitution cavity radiometer that can be operated at

Advances in NIST Standard Rockwell Diamond Indenters

January 1, 1998
Author(s)
Jun-Feng Song, Samuel R. Low III, David J. Pitchure, Theodore V. Vorburger
Recent developments in standard hardness machines and microform calibration techniques have made it possible to establish a worldwide unified Rockwell hardness scale with metrological traceability. This includes the establishments of the reference
Displaying 52401 - 52425 of 73697
Was this page helpful?