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Displaying 48876 - 48900 of 74167

Computation of Light Scattered Into Detector

January 1, 2000
Author(s)
Egon Marx
To compare the measured bidirectional reflectance distribution function (BRDF) of a rough surface to the results of a computation, we have to take into account the aperture of the detector and, more generally, the properties of the measuring instrument. We

Decoherence of Quantum Superpositions Through Coupling to Engineering Reservoirs

January 1, 2000
Author(s)
C J. Myatt, B E. King, Q A. Turchette, C A. Sackett, D Kielpinski, Wayne M. Itano, W M. Monroe, David J. Wineland
The theory of quantum mechanics applies to closed systems. In such ideal situations, a single atom can, for example, exist simultaneously in a superposition of two different spatial locations. In contrast, real systems always interact with their

Definitions of Terms and Modes Used at NIST for Value-Assignment of Reference Materials for Chemical Measurements

January 1, 2000
Author(s)
Willie E. May, Reenie M. Parris, C M. Beck, John D. Fassett, Robert R. Greenberg, Franklin R. Guenther, Gary W. Kramer, Stephen Wise, T E. Gills, Jennifer C. Colbert, R J. Gettings, Bruce S. MacDonald
Standard Reference Materials (SRMs) are certified reference materials (CRMs) issued by NIST that are well-characterized using state-of-the-art measurement methods and/or techniques for the determination of chemical compositon and physical properties. SRMs

Density Variations in Scanned Probe Oxidation

January 1, 2000
Author(s)
K Morimoto, F Perez-murano, John A. Dagata
The density of oxide nanostructures produced by scanned probe microscopy (SPM) is a function of substrate doping and voltage-pulse parameters. The total oxide thickness and molar-volume ratio of SPM oxide, obtained from high-resolution cross-sectional
Displaying 48876 - 48900 of 74167
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