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Absolute index of refraction and its temperature dependence of calcium fluoride, barium fluoride, and strontium fluoride near 157 nm, ed. by C.H. Progler
Published
Author(s)
John H. Burnett, R Gupta, U And griesmann
Citation
Optical Microlithography XIII Proc SPIE 4000
Volume
4000
Pub Type
Journals
Citation
Burnett, J.
, Gupta, R.
and And, U.
(2000),
Absolute index of refraction and its temperature dependence of calcium fluoride, barium fluoride, and strontium fluoride near 157 nm, ed. by C.H. Progler, Optical Microlithography XIII Proc SPIE 4000
(Accessed October 15, 2025)