Burnett, J.
, Gupta, R.
and And, U.
(2000),
Absolute index of refraction and its temperature dependence of calcium fluoride, barium fluoride, and strontium fluoride near 157 nm, ed. by C.H. Progler, Optical Microlithography XIII Proc SPIE 4000
(Accessed September 20, 2024)
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Absolute index of refraction and its temperature dependence of calcium fluoride, barium fluoride, and strontium fluoride near 157 nm, ed. by C.H. Progler
Published
Author(s)
John H. Burnett, , U And griesmann
Citation
Optical Microlithography XIII Proc SPIE 4000
Volume
4000
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 2000, Updated February 17, 2017