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NIST Authors in Bold

Displaying 46951 - 46975 of 73697

Calibration of High-Resolution X-Ray Tomography with Atomic Force Microscopy

November 1, 2000
Author(s)
A Kalukin, B Winn, Yong Wang, C Jacobsen, Z Levine, Joseph Fu
For two-dimensional x-ray imaging of thin films, the technique of scanning transmission x-ray microscopy (STXM) has achieved images with feature sizes as small as 40 nm in recent years. However, calibration of three-dimensional tomographic images that are

Calibration of High-Resolution X-Ray Tomography With Atomic Force Microscopy

November 1, 2000
Author(s)
A R. Kalukin, B Winn, S S. Wang, C Jacobsen, Zachary H. Levine, Joseph Fu
For two-dimensional x-ray imaging of thin films, the technique of scanning transmission x-ray miscroscopy (STXM) has achieved images with feature sizes as small as 40 nm in recent years. However, calibration of three-dimensional tomographic images that are

CODATA Recommended Values of the Fundamental Physical Constants: 1998

November 1, 2000
Author(s)
Peter J. Mohr, Barry N. Taylor
This paper gives the 1998 self-consistent set of values of the basic constants and conversion factors of physics and chemistry recommended by the Committee on Data for Science and Technology (CODATA) for international use. Further, it describes in detail

Combined 63,65 Cu NQR and NMR Study of Y 1-x Ca x Ba 2 Cu 3 O y

November 1, 2000
Author(s)
D M. Potrepka, J. I. Budnick, A R. Moodenbaugh, Daniel A. Fischer, W A. Hines
Zero-field 63,65Cu nuclear quadrupole resonance (NQR) and nuclear magnetic resonance (NMR) spectra were obtained at 1.3 K for powdered samples of Y 1-xCa xBa 2Cu 3O y with 0 less than or equal to} x less than or equal to} 0.20. The results for the

Countermeasures for Mobile Agent Security

November 1, 2000
Author(s)
Wayne Jansen
Security is an important issue for the widespread deployment of applications based on agent technology. It is generally agreed that without the proper countermeasures in place, use of agent-based applications will be severely impeded. However, not all

Cross Comparison of Direct Strength Testing Techniques on Polysilicon Films

November 1, 2000
Author(s)
D A. LaVan, T Tsuchiya, G Coles, W G. Knauss, I Chasiotis, David T. Read
Several direct and indirect testing techniques to characterize the strength and distribution in strength of structural thin films have been developed with widely varying results appearing in the literature (roughly 1 to 4 GPa for polysilicon). Much of the

Damage-Resistant Brittle Coatings

November 1, 2000
Author(s)
Brian R. Lawn, K S. Lee, Herzl Chai, Antonia Pajares, D K. Kim, S Wuttiphan, I M. Peterson, X Z. Hu
A conceptually new approach to the design of brittle coating structures on soft substrates, based on prevention of crack initiation rather than on customary crack containment, is outlined. Concentrated loads produce two competing coating fracture modes

Dark-Soliton States of Bose Einstein Condensates in Anisotropic Traps

November 1, 2000
Author(s)
D Feder, M S. Pindzola, L A. Collins, B I. Schneider, Charles W. Clark
Dark soliton states of Bose-Einstein condensates in anisotropic traps are studied by direct solution of the time-dependent Gross-Pitaevskii equation in three dimensions. The ground and self-consistent excited states for a completely anisotropic harmonic

Development of NIST Standard Bullets and Casings Status Report

November 1, 2000
Author(s)
Jun-Feng Song, Theodore V. Vorburger, Alim A. Fatah
In April 1998, two prototype standard bullets were developed at the National Institute of Standards and Technology (NIST). In October 1999, prototype standard casings were also developed at NIST. The standard bullets and casings are intended for use in

Direct Blind Deconvolution II. Substitute Images and the Beak Method

November 1, 2000
Author(s)
Alfred S. Carasso
The BEAK method is an FFT-based direct blind deconvolution technique previously introduced by the author, and applied to a limited but significant class of blurs that can be expressed as convolutions of 2-D symmetric L vy probability density functions

Dispersion of the Temperature Dependence of the Retardance in SiO 2 and MgF 2

November 1, 2000
Author(s)
Shelley M. Etzel, Allen Rose, E. Wang
We have directly measured the retardance versus temperature for single-crystal quartz (SiO 2) and magnesium fluoride (MgF 2) at wavelengths of 633, 788, 1318, and 1539 nm and over a temperature range of 24-80 0C. To our knowledge, the temperature
Displaying 46951 - 46975 of 73697
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