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Displaying 46976 - 47000 of 74220

Diffuse Reflectance Spectroscopy for In Situ Process Monitoring and Control During Molecular Beam Epitaxy Growth of InGaAs Pseudomorphic High Electron Mobility Transistors

September 29, 2000
Author(s)
Jonathan E. Guyer, W. F. Tseng, Joseph G. Pellegrino
We report the use of diffuse reflectance spectroscopy for active, closed-loop control of substrate temperature during the growth of a modulation doped heterostructure. Measurement and control of substrate temperature is a common difficulty for molecular

On-Wafer Measurement of Transmission Lines On Lossy Silicon Substrates

September 25, 2000
Author(s)
Uwe Arz, Dylan Williams, Hartmut Grabinski
This paper examines broadband measurement techniques for electrical properties of planar transmission lines built on lossy silicon substrates. We start by investigating the performance of a new formulation of the calibration com-parison method which is

Automated Tracking of Structural Steel Members at the Construction Site

September 18, 2000
Author(s)
K M. Furlani, L E. Pfeffer
This paper presents further development and experimental testing of Comp-TRAK, a prototype system for identification and spatial tracking of structural steel components on a live construction site. Comp-TRAK is a web-based system for rapid tracking of

Attractors, Chain Transitive Sets and Invariant Measures

September 15, 2000
Author(s)
Fern Y. Hunt
This paper discusses an easy to implement procedure for approximating the long time behavior of iterates of maps. Applications include to finding the roots of a complex polynomial and approximating attractors. The method uses the theory of Markov chains.

Mutation Operators for Specifications

September 15, 2000
Author(s)
Paul E. Black, Vadim Okun, Yaacov Yesha
Testing has a vital support role in the software engineering process, but developing tests often takes significant resources. A formal specification is a repository of knowledge about a system, and a recent method uses such specifications to automatically

1999 Survey of Forensic Standard Reference Materials

September 13, 2000
Author(s)
Alim A. Fatah
A survey was conducted to assess the reference materials and collections that were available in forensic laboratories to determine which were not available and in greatest demand. This report presents the results of that survey. The survey included

Techniques to Measure Magnetic Domain Structures

September 11, 2000
Author(s)
Robert Celotta, John Unguris, Michael H. Kelley, Daniel T. Pierce
A summary of the current techniques for magnetic domain imaging of materials, including the practical aspects of each technique, the requirements on the sample, the specimen modification allowed and the problems normally encountered. References to more

The Biometric Consortium 2000 Conference Proceedings

September 11, 2000
Author(s)
Fernando L. Podio, J S. Dunn
The Biometric Consortium 2000 Conference examined rapid advances in biometric technologies and applications and explored new developments in the areas of metrology, assurance, and standards. Biometrics integration with information technology products was

Marginally Flammable Materials: Burning Velocity of Trans-Dichloroethylene

September 10, 2000
Author(s)
Gregory T. Linteris, Valeri I. Babushok
The overpressure dynamics and explosion hazard of commodity materials under full-scale conditions are often assessed through laboratory measurements of their laminar burning velocity. We present the first measurements of the flame speed of trans-1,2

Marginally Flammable Materials: Burning Velocity of Trans-Dichloroethylene.

September 10, 2000
Author(s)
Gregory T. Linteris, Valeri I. Babushok
The overpressure dynamics and explosion hazard of commodity materials under full-scale conditions are often assessed through laboratory measurements of their laminar burning velocity. We present the first measurements of the flame speed of trans-1,2

A New IEC Standard on the Measurement of Power Quality Parameters

September 1, 2000
Author(s)
Francois D. Martzloff
Following an initiative from the French and the U.S. National Committees, the IEC Technical Committee TC77 charged its Subcommittee 77A (Low-Frequency Phenomena) with the development of a new standard on the measurement of power quality parameters. The
Displaying 46976 - 47000 of 74220