Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Bulk and Surface Evidence for the Long Range Spatial Modulation of X-Ray Absorption in the AlPdMn Quasicrystal at Bragg Incidence

Published

Author(s)

G Cappello, A Dechelette, F Schmithusen, S Decossas, J Chevrier, F Comin, V Formoso, M. De Boissieu, Terrence J. Jach, R. Colella, T Lograsso, C Jenks, D W. Delaney

Abstract

An X-ray standing waves experiment was performed at the ID32 beam line of the ESRF on an Al-PD-Mn quasicrystal with the X-ray beam at normal incidence. The X-ray photoemission core levels for each element were recorded to probe the surface. The drain current, i.e. the electron current from ground needed to neutralize the irradiated sample and to compensate the photoemitted electrons has was also recorded as a bulk probe that integrates over all atoms of the sample. Within the two-beam approximation applied to quasicrystals, a simple analysis of this effect is proposed. This provides a direct-space illustration of the diffraction process in a quasiperiodic structure.
Citation
Materials Science and Engineering A-Structural Materials Properties Microstructure and Processing
Volume
294-296

Keywords

quasicrystal, surfaces, x-ray diffraction, x-ray standing wave

Citation

Cappello, G. , Dechelette, A. , Schmithusen, F. , Decossas, S. , Chevrier, J. , Comin, F. , Formoso, V. , De Boissieu, M. , Jach, T. , Colella, R. , Lograsso, T. , Jenks, C. and Delaney, D. (2001), Bulk and Surface Evidence for the Long Range Spatial Modulation of X-Ray Absorption in the AlPdMn Quasicrystal at Bragg Incidence, Materials Science and Engineering A-Structural Materials Properties Microstructure and Processing (Accessed October 14, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 31, 2000, Updated October 12, 2021