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Search Publications

NIST Authors in Bold

Displaying 46926 - 46950 of 73697

Java-Based XML Utility for the NIST Machine Tool Data Repository

November 30, 2000
Author(s)
Joseph A. Falco
The National Institute of Standards and Technology (NIST) is developing a specification for a standard format to represent machine tool performance test data. This data is used for machine acceptance, predictive maintenance, error compensation, and to

Federal Information Technology Security Assessment Framework

November 28, 2000
Author(s)
E Roback
[Prepared for the CIO Council's Security, Privacy, and Critical Infrastructure Committee] The Federal Information Technology (IT) Security Assessment Framework (or Framework) provides a method for agency officials to 1) determine the current status of

Infrared Spectroscopic Ellipsometry of Self-Assembled Monolayers

November 28, 2000
Author(s)
Curtis W. Meuse
Ellipsometry measures the relative intensity of and the phase difference between the parallel (p) and perpendicular (s) components of an electric field vector interacting with a sample. In this paper, a technique using polarized Fourier transform infrared

Design and Optimization of a Diode-Pumped Fiber-Coupled Yb:Er Glass Waveguide Laser

November 20, 2000
Author(s)
W. Liu, S. N. Houde-Walter, D. L. Veasey, A P. Peskin
An adaptive simulated annealing optimization algorthm is used to derive laser rate equation and wavegurding models with which the best design for a diode-pumped fiber-coupled, Yb. Er glass waveguide laser can be determined. Material parameters that

A Low Temperature STM Facility for the Study of Quantum and Spin Electronic Systems

November 15, 2000
Author(s)
Joseph A. Stroscio, Robert Celotta, Steven R. Blankenship, E Hudson, Aaron P. Fein
We describe an experimental system with the goal of providing new measurement capabilities for the study of quantum and spin electronic systems on the nanometer scale. The physical information desired in such systems includes: the quantized electron energy

NIST Centennial Celebration Symposium Highlight

November 15, 2000
Author(s)
Alan D. Mighell, Winnie K. Wong-Ng
The Centennial Celebration of the National Institute of Standards and Technology (NIST), formerly known as the Bureau of Standards (NBS), takes place in the year 2001. NIST has a long history (>50 years) of crystallographic research, and has made

NIST/SEMATECH Collaboration: Application of Nano-Tips to Production CD-SEMs

November 15, 2000
Author(s)
Andras Vladar, Michael T. Postek
This work documents the first part of a two-part study about the application of nano-tips to critical dimension (CD) scanning electron microscopes used in integrated circuit production. Nano-tips, by comparison to all conventional cold, thermally assisted

X-Ray Anomalous Scattering Study of a Charge-Ordered State in NaV 2 O 3

November 13, 2000
Author(s)
Shin-ichi Nakao, K Ohwada, N Takesue, Y Fujiii, M Isobe, Y Ueda, M V. Zimmermann, J P. Hill, D Gibbs, Joseph Woicik, L Koyama, Y Murakami
Charge ordering of V 4+ and V 5+ in NaV 2O 5 has been studied by an X-ray diffraction technique using anomalous scattering near a vanadium K-aborption edge to critically enhance a contrast between the two ions. A dramatic energy dependence of the

Collaboration Between NPL and NIST

November 7, 2000
Author(s)
K B. Gebbie
Since its inception in 1901, the National Institute of Standards and Technology (NIST) (then the National Bureau of Standards) has sought guidance from its sister institute, the National Physical Laboratory. For almost a century, the two institutions have

Cooper Minima in the Photoemission Spectra of Solids

November 6, 2000
Author(s)
S Molodtsov, S Halilov, V Servedio, W Schneider, S Danzenbaecher, J Hinarejos, M Richter, C Laubschat
Variations of the photoionization cross-section of valence states as a function of interatomic distance are studied by means of atomic and solid-state density functional approaches and compared with photoemission data. In contrast to the free atom case, a

Open Architecture Controls: The Key to Interoperability

November 2, 2000
Author(s)
John Evans
Integration costs for industrial robots are two to four times the cost of the robots themselves. As manufacturers work toward ever shorter product cycles and lower production costs, integration costs for manufacturing systems is becoming increasingly

A Shape Modeling Application Program Interface (API) for the STEP Standard

November 1, 2000
Author(s)
Mike Pratt, B D. Anderson
The international standard ISO 10303 for the exchange of product models and associated data between different computer aided design (CAD) and other engineering systems was first issued in 1994. This paper reports on current work on extending the standard

A Web-Based Process/Material Advisory System

November 1, 2000
Author(s)
Y Chen, Satyandra K. Gupta, Shaw C. Feng
This paper describes a web-based process/material advisory system that can be used during conceptual design. Given a set of design requirements for a part during conceptual design stage, our system produces process sequences that can meet the design

Accelerating Scientific Discovery through Computation and Visualization

November 1, 2000
Author(s)
James S. Sims, John G. Hagedorn, Peter M. Ketcham, Steven G. Satterfield, Terence J. Griffin, William L. George, H A. Fowler, B A. am Ende, Howard Hung, Robert B. Bohn, John E. Koontz, Nicos Martys, Charles E. Bouldin, James A. Warren, D L. Feder, Charles W. Clark, Bernard J. Filla, Judith E. Terrill
The rate of scientific discovery can be accelerated through computation and visualization. This acceleration results from the synergy of expertise, computing tools, and hardware for enabling high performance computation, information science, and

Aerodynamic Study of a Vane-Cascade Swirl Generator

November 1, 2000
Author(s)
J F. Widmann, S R. Charagundla, Cary Presser
The air flow through a vane-cascade swirl generator is examined both experimentally and numerically to characterize the inlet combustion air flow entering a reference spray combustion facility at NIST. A three-dimensional model is used to simulate the

Al, B, and Ga Ion-Implantation Doping of SiC

November 1, 2000
Author(s)
E Handy, M V. Rao, O W. Holland, P Chi, K A. Jones, M A. Derenge, R D. Vispute, T Venkatesan
A Series of single energy Al, B, and Ga ion implants were performed in the energy range 50 keV - 4 MeV into 6H-SiC to characterize the implant depth profiles using secondary ion mass spectrometry (SIMS). From the implant depth profiles empirical formulae

An Assessment Standard for the Evaluation of Display Measurement Capabilities

November 1, 2000
Author(s)
John M. Libert, Paul A. Boynton, Edward F. Kelley, Steven W. Brown, Yoshi Ohno
A prototype display measurement assessment transfer standard (DMATS) is being developed by NIST to assist the display industry in standardizing measurement methods used to quantify the performance of electronic displays. Designed as an idealized electronic
Displaying 46926 - 46950 of 73697
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