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NIST Authors in Bold

Displaying 45251 - 45275 of 73697

Atomic Engineering of Spin Valves Using Ag as a Surfactant

June 1, 2001
Author(s)
D X. Yang, B Shashishekar, H D. Chopra, P J. Chen, William F. Egelhoff Jr.
In this study, de magnetron sputtered NiO (50 nm)/Co (2.5 nm)/Cu (1.5 nm)/Co(3.0 nm) bottom spin valves were studied with and without Ag as a surfactant. At Cu spacer thickness of 1.5 nm, a strong positive coupling >13.92 kA/m (>175 Oe) between NiO-pinned

Atomic Spectroscopy at NIST 2001

June 1, 2001
Author(s)
Joseph Reader
The program in atomic spectroscopy at NIST continues to provide accurate reference data on spectral lines and energy levels for a wide variety of important applications. With spectrometers at NIST that can record spectra from the extreme ultraviolet (1 nm)

Characterizing Interfacial Roughness by Light Scattering Ellipsometry

June 1, 2001
Author(s)
Thomas A. Germer
The polarization of light scattered by oxide films thermally grown on photolithographically-generated microrough silicon surfaces was measured as functions of scattering angle. Using the predictions of first-order vector perturbation theory for scattering

Chemical Crosstalk Between Heated Gas Microsensor Elements Operating in Close Proximity

June 1, 2001
Author(s)
M C. Wheeler, J E. Tiffany, R M. Walton, Richard E. Cavicchi, Stephen Semancik
Gas microsensor arrays often have closely-spaced elements typically separated by hundreds of microns. For such devices, crosstalk between elements operated within a gaseous environment is a concern because sensing materials held at elevated temperatures

Electrical CD Metrology and Related Reference Materials

June 1, 2001
Author(s)
Michael W. Cresswell, Richard A. Allen
In the fabrication of integrated circuits, the steps of depositing a thin film of conducting material, patterning it photo-lithographically, and then etching it and stripping the remaining resist, are repeated several times as required levels are created

Engineering Principles for Information Technology Security

June 1, 2001
Author(s)
G Stoneburner
In June 2001, ITL released NIST Special Publication (SP) 800-27, Engineering Principles for Information Technology Security (EP-ITS), by Gary Stoneburner, Clark Hayden, and Alexis Feringa. Engineering Principles for Information Technology (IT) Security (EP

Fast Vibrational Relaxation of OH (N=9) by Ammonia and Ozone

June 1, 2001
Author(s)
S A. Nizkorodov, W W. Harper, David Nesbitt
Vibrational removal of OH(X 2II) out of v=9 by 0 3 and NH 3 has been studied in a flow cell flash-photolysis apparatus using high-resolutiondirect infrared absorption detection of OH in the v=11

Fast Vibrational Relaxation of OH (v=9) By Ammonia and Ozone

June 1, 2001
Author(s)
S A. Nizkorodov, W W. Harper, David Nesbitt
Vibrational relaxation of OH(X 2II) in the Ņ=9 state by O 3 and NH 3 has been studied via flash-photolysis using high-resolution direct infrared absorption detection of OH in the Ņ= 11

Final Report of the e-SRM Committee on the Optimal Delivery of Services to Customers for Standard Reference Materials

June 1, 2001
Author(s)
John C. Travis, Sally Bruce, D J. Clarke, James R. Ehrstein, Michael S. Epstein, Daniel G. Friend, T E. Gills, Kenneth G. Inn, Larry L. Lucas, James E. Potzick, M H. Saunders, N M. Trahey, G M. Ugiansky, R. Michael Verkouteren, D P. Vigliotti, Robert Watters
The e-SRM committee was formed at the request of Technology Services (TS) to recommend ways to employ appropriate technologies to optimize the consistency, efficiency, and effectiveness with which NIST provides technical support to customers for Standard

Flow Visualization of Polymer Processing Additive Effects

June 1, 2001
Author(s)
Kalman D. Migler, C Lavallee, M P. Dillon, S S. Woods, C L. Gettinger
Flow visualization was used to understand how polymer-processing additives (PPA) eliminate sharkskin in linear low-density polyethylene (LLDPE). A sapphire capillary die was used to image the coating of the PPA onto the die wall. Depth resolved optical

Generalization of a Two-Dimensional Micromagnetic Model to Nonuniform Thickness

June 1, 2001
Author(s)
Donald G. Porter, Michael J. Donahue
A two-dimensional micromagnetic model is extended to support simulation of films with non-uniform thickness. Zeeman and crystalline anisotropy energies are scaled by the local thickness, and exchange interaction between neighbor elements is scaled by the

Hard X-Ray Spectrometers for the National Ignition Facility

June 1, 2001
Author(s)
J Seely, C Back, R Deslattes, Lawrence T. Hudson, G Holland, P Bell, M Miller
A National Ignition Facility (NIF) core diagnostic instrument has been designed and will be fabricated to record x-ray spectra in the 1.1-20.1 keV energy range. The High-Energy Electronic X-Ray (HENEX) instrument has four reflection crystals with
Displaying 45251 - 45275 of 73697
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