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Displaying 42876 - 42900 of 74196

X-Ray Spectroscopy of Trapped Ions With a Microcalorimeter on the NIST Electron Beam Ion Trap

December 1, 2002
Author(s)
E Takacs, John D. Gillaspy, L P. Ratliff, K Makonyi, J M. Laming, E Silver, H. Schnopper, M Barbera, J. Beeman, E. E. Haller, N. Madden
The electron beam ion trap (EBIT) was invented about 15 years ago. Judging from the wide range of experiments performed on the machine since its inception, EBITs have become one of the most successful devices to Produce, trap and study the structure and

Binary Diffusion Coefficients for Combustion Modeling

November 30, 2002
Author(s)
William S. McGivern, Jeffrey A. Manion
Recent studies have demonstrated that combustion models can be as sensitive to the binary diffusion coefficients of the fuel species as to the kinetics of major chemical reactions. We have constructed a reversed-flow chromatographic apparatus for the

Preliminary Concept Trial of the Semi-Automated Paint Containment System

November 30, 2002
Author(s)
Richard J. Norcross
The Carderock Division of the Naval Surface Warfare Center (NSWC-CD) is developing the Automated Paint Application, Containment, and Treatment System (APACTS) to apply anti-corrosive and anti-fouling paints in an environmentally sound manner. NSWCCD

Calibration of Nonreciprocal Radar Systems

November 14, 2002
Author(s)
Lorant A. Muth
The calibration of nonreciprocal radars has been studied extensively. Here we present a robust calibration procedure using Fourier analysis of back-scatter data from a rotating dihedral. We derive a set of nonlinear equations in terms of the Fourier

Calibrating Photoreceiver Response to 110 GHz

November 13, 2002
Author(s)
Tracy S. Clement, Dylan F. Williams, Paul D. Hale, Juanita M. Morgan
We have measured the magnitude and phase responses of a photoreceiver to 110 GHz using a calibrated electro-optic sampling system. The frequency range of the calibration is limited only by our 1 mm coaxial connectors.

Composition standards for III-V semiconductor epitaxial films

November 11, 2002
Author(s)
Kristine A. Bertness, Lawrence H. Robins, J T. Armstrong, Ryna B. Marinenko, Albert J. Paul, Marc L. Salit
A program is underway at NIST to establish standard reference materials (SRMs) for the calibration of instruments used to measure the chemical composition of epitaxially grown III-V semiconductor thin films. These SRMs are designed for the calibration of

Ex-situ Characterization of InGaAsP

November 11, 2002
Author(s)
Alexana Roshko, Kristine A. Bertness
An interlaboratory comparison was undertaken to assess differences in X-ray and photoluminescence measurements from different laboratories. Six InGaAsP specimens, with nominal photoluminescence peak wavelengths of 1.1, 1.3 and 1.5 υm, were measured

Trace water detection in semiconductor-grade phosphine gas

November 11, 2002
Author(s)
Kristine A. Bertness, Susan Y. Lehman, Joseph T. Hodges, H. H. Funke, Mark W. Raynor
We are applying cavity ring-down spectroscopy (CRDS) to measure water concentrations in nitrogen and, for the first time to our knowledge, in phosphine. Semiconductor-grade phosphine cylinders from different suppliers contained water in the several ppm

Analysis of Phase-Dependent RCS Measurements

November 8, 2002
Author(s)
Lorant A. Muth, Timothy Conn
Free space coherent radar cross section measurements on a moving target will trace a circle centered on the origin of the complex (I,Q) plane. Noise will introduce only small random variations in the radius of the circle. In real measurement configurations

Methods to Estimate and Reduce Leakage Bias Errors in Planar Near-Field Measurements

November 8, 2002
Author(s)
Allen C. Newell, Jeffrey R. Guerrieri, Katherine MacReynolds
This paper describes two methods that can be used to measure the leakage signals, predict the effect on the far-field pattern and correct the measured data for leakage bias errors without additional near-field measurements. One method is an extension and

Spherical Near-Field Antenna Measurements Using Nonideal Measurement Locations

November 8, 2002
Author(s)
Ronald C. Wittmann, Bradley Alpert, Michael H. Francis
We introduce a near-field spherical scanning algorithm that relaxes the usual condition requiring data points to be on a regular spherical grid. Computational complexity is of the same order as for the standard (ideal-positioning) spherical-scanning

Spherical Scanning Measurements Using Truncated Data Sets

November 8, 2002
Author(s)
Ronald C. Wittmann, Carl F. Stubenrauch, Michael H. Francis
We discuss the mitigation of truncation errors in spherical scanning measurement. The main emphasis is the spherical harmonic representation of probe transmitting and receiving functions; however, our method is applicable to near-field measurement of

SplitC Measurement Software

November 8, 2002
Author(s)
Michael D. Janezic
SplitC is a software package for measuring the permittivity and loss tangent of dielectric materials using a split-cylinder resonator. A new theoretical model for the split-sylinder resonator has been incorporated into SplitC, thereby improving the

Ultra-Wideband Antenna Pattern Characterization in a Non-Ideal EM Facility

November 8, 2002
Author(s)
Jason Veneman, David R. Novotny, Chriss A. Grosvenor, Robert T. Johnk, Seturnino Canales
We present and analyze a procedure for performing relative, ultra-wideband antenna pattern measurements in a non-ideal EM facility. Ultra-wideband, short-impulse, TEM horn transmission measurements were performed and compared with computer-modeled

Ultra-Wideband TEM-Horn Antenna Design using Numerical Methods

November 8, 2002
Author(s)
Chriss A. Grosvenor, David R. Novotny, Jason Veneman, Seturnino Canales
TEM, time-domain antennas are designed to reproduce accurately the time characteristics of an impulsive, incoming field. The response to the fields must be constant in amplitude and linear in phase for minimal distortion. Numerical techniques are employed
Displaying 42876 - 42900 of 74196
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