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Displaying 41651 - 41675 of 73697

Early Reliability Assessment Using Deep Censoring

January 1, 2003
Author(s)
Harry A. Schafft, Linda M. Head, Jason Gill, Timothy D. Sullivan
A method is described for making direct characterizations of the early part of the intrinsic electromigration fail-time distribution of interconnects. The method involves stressing a large number of test lines only long enough for a relatively few lines to

Earning the Stamp of Approval: How to Achieve Optimal Usability

January 1, 2003
Author(s)
Susan L. Makar
Since the NIST Virtual Library (NVL) was first launched in 1994, scientists and engineers at the National Institute of Standards and Technology have relied on it for their research needs. The NVL offers access to valuable scientific databases and

EEEL - Office of Law Enforcement Standards, Programs, Activities, and Accomplishments

January 1, 2003
Author(s)
Thomas J. Russell, Susan M. Ballou, Alim A. Fatah, A G. Lieberman, Philip J. Mattson
The Office of Law Enforcement Standards (OLES) National Institute of Standards and Technology (NIST) helps law enforcement and criminal justice agencies ensure that the equipment they purchase and the technologies they use are safe, dependable, and highly

Effect of transverse compressive stress on transport critical current density of Y-Ba-Cu-O coated Ni and Ni-W RABiTS tapes

January 1, 2003
Author(s)
Najib Cheggour, John (Jack) W. Ekin, Cameron C. Clickner, Ron Feenstra, P Goyal, D F. Paranthaman, Noel Rutter
Transport properties of yttrium-barium-copper-oxide (YBCO) coatings on both pure-nickel and nickel-3at%tungsten rolling-assisted-biaxially-textured substrates (RABiTS) were tested under transverse compressive stress up to 180 MPa. Transport critical

Effects of noise level in fitting in situ optical reflectance spectroscopy data

January 1, 2003
Author(s)
Chih-chiang Fu, Kristine A. Bertness, C. M. Wang
Curve-fitting of simulated optical reflectance spctroscopy data is used to evaluate the accuracy of parameters derived from the fits of actual data. These simulations show that to determine the index of refraction 'n' to an accuracy of 0.0015

Electromagnetic Technology Division 2002 Technical Accomplishments

January 1, 2003
Author(s)
Sara E. Metz
The roughly forty staff and guest scientists in the Electromagnetic Technology Division take great pride in bringing you this brief report on recent progress in our Division. We have a long history of inventing and disseminating new standards and
Displaying 41651 - 41675 of 73697
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