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Displaying 41626 - 41650 of 73969

Compositional Homogeneity of Ferroelectric (Pb,La)(Ti,Zr)O- 3 Thick Films

February 1, 2003
Author(s)
S Bernik, Ryna B. Marinenko, J Holc, Z Samardzija, M Ceh, M Kosec
Quantified WDS x-ray element maps were used to characterize active PLZT layers on Pt/PLZT/Al 2O 3 substrates, one fired at 1050 C and the other at 1150 C. In the layer fired at 1050 C randomly distributed micrometer size compositional irregularities were

Computerized Fire Simulations For Use In Fatal Fire Investigations

February 1, 2003
Author(s)
Daniel M. Madrzykowski
Learning Objective: To develop a conceptual understanding of fire modeling, model capabilities and the application of fire models to investigations.In conjunction with the National Institute for Occupational Safety and Health (NIOSH), the National

Concepts for Automating Systems Integration

February 1, 2003
Author(s)
Edward J. Barkmeyer Jr., Allison Barnard Feeney, Peter O. Denno, David W. Flater, Donald E. Libes, Michelle P. Steves, Evan K. Wallace
The problem of software systems integration getting independently developed software components to communicate in order to support a business application has been altered by the introduction of new software technologies, but by no means eliminated. NIST

Crack Growth Threshold in Soda Lime Silicate Glass: Role of Hold-Time

February 1, 2003
Author(s)
J -. Guin, Sheldon M. Wiederhorn
Atomic force microscopy was used to examine the shapes of cracks and residual features left behind on the fracture surface after holding cracks at a stress intensity factor below the fatigue threshold for soda lime silicate glass. After propagating a crack

Current Projects in Display Metrology at the NIST Flat Panel Display Laboratory

February 1, 2003
Author(s)
Paul A. Boynton, Edward F. Kelley, John M. Libert
The NIST Flat Panel Display Laboratory (FPDL) is operated through the Display Metrology Project (DMP) of the Electronic Information Technology Group in the Electricity Division of the Electronics and Electrical Engineering Laboratory of NIST. The DMP works

Design and Uncertainty Analysis for a PVTt Gas Flow Standard

February 1, 2003
Author(s)
John D. Wright, Aaron N. Johnson, Michael R. Moldover
A new pressure, volume, temperature, and time (PVTt) primary gas flow standard has been constructed at the National Institute of Standards and Technology with an expanded uncertainty of between 0.02 % and 0.05 % (k = 2). The standard covers a flow range of

Droplet-Laden Homogeneous Turbulent Flow Over Unheated and Heated Cylinders

February 1, 2003
Author(s)
Cary Presser, G Papadopoulos, J F. Widmann
The dispersal of high boiling point liquid fire suppression agents around solid obstacles is investigated to obtain a better understanding of the physical processes of droplet transport in cluttered spaces. To this end, the present experimental

Dynamic Error Correction of a Digitizer for Time Domain Metrology

February 1, 2003
Author(s)
David I. Bergman
A method for numerical correction of distortion in a digitizer used for metrology applications is described. Investigation of the digitizer's error behavior in the phase plane leads to the development of an analytic error model that describes the digitizer

Facility for Extreme Ultraviolet Reflectometry of Lithography Optics

February 1, 2003
Author(s)
Charles S. Tarrio, S Grantham, Thomas B. Lucatorto
Currently the most demanding application of extreme-ultraviolet (EUV) optics is in lithography. A commercial extreme-ultraviolet stepper will likely have six or more normal-incidence reflective optics, and the largest of these will be tens of cm in

Finding Similar Classes with a Simplified Metamodel

February 1, 2003
Author(s)
David W. Flater
To integrate conceptual models and other types of models, it is necessary to identify the portions of the models that overlap (i.e.,find similar classes) and resolve any conflicts. Complete automation of this task is generally considered infeasible

Geometric Area Measurements of Circular Apertures for Radiometry at NIST

February 1, 2003
Author(s)
J B. Fowler, Maritoni A. Litorja
NIST has established a geometric aperture-area measurement facility for circular apertures. The instrument consists of an interferometrically controlled XY translation stage for high-accuracy positioning and a video microscope for detection fo the aperture

Improved Broadband Blackbody Calibrations at NIST for Low-Background Infrared Applications

February 1, 2003
Author(s)
Adriaan C. Carter, Timothy M. Jung, Allan W. Smith, Steven R. Lorentz, Raju V. Datla
The Low Background Infrared (LBIR) facility at The National Institute of Standards and Technology (NIST) has continued to develop its facilities and knowledge base to meet the needs of the infrared community. Improvements in refrigeration capability at the

Incoherent Neutron Scattering and the Dynamics of Thin Film Photoresist Polymers

February 1, 2003
Author(s)
Christopher L. Soles, Jack F. Douglas, Eric K. Lin, Joseph~undefined~undefined~undefined~undefined~undefined Lenhart, Ronald L. Jones, Wen-Li Wu, D M. Goldfarb, M Angelopoulos
Elastic incoherent neutron scattering is employed to parameterize changes in the atomic/molecular mobility in lithographic polymers as a function of film thickness. Changes in the 200 MHz and faster dynamics are estimated in terms of a harmonic oscillator

Measured Versus Predicted Performance of Building Integrated Photovoltics

February 1, 2003
Author(s)
Mark W. Davis, Arthur H. Fanney, Brian P. Dougherty
The lack of predictive performance tools creates a barrier to the widespread use of building integrated photovoltaic panels. The National Institute of Standards and Technology (NIST) has created a building integrated photovoltaic (BIPV) test bed to capture
Displaying 41626 - 41650 of 73969
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