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Two Aspects of Thin Film Analysis: Boron Profile and Scattering Length Density Profile

Published

Author(s)

Heather H. Chen-Mayer, George P. Lamaze, Kevin Coakley, Sushil K. Satija
Citation
Nuclear Instruments & Methods in Physics Research Section A-Accelerators Spectrometers Detectors and Associated Equipment
Volume
505
Issue
1

Citation

Chen-Mayer, H. , Lamaze, G. , Coakley, K. and Satija, S. (2003), Two Aspects of Thin Film Analysis: Boron Profile and Scattering Length Density Profile, Nuclear Instruments & Methods in Physics Research Section A-Accelerators Spectrometers Detectors and Associated Equipment (Accessed April 24, 2024)
Created May 31, 2003, Updated October 12, 2021