Levine, Z.
(2003),
Tomography in the Multiple Scattering Regime of the Scanning Transmission Electron Microscope, Applied Physics Letters (Accessed May 11, 2026)
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Tomography in the Multiple Scattering Regime of the Scanning Transmission Electron Microscope
Published
Author(s)
Abstract
To date, nearly all tomography based on electron microscopy has been performed on samples 1 m or less thick. It has also relied on Beer s Law. In this work, tomographic reconstructions of a simulated scans of a photonic band-gap crystal based on bright-field imaging with a scanning transmission electron microscope are made assuming (1) multiple scattering or (2) the standard Beer s Law model. The results suggest that should be possible to treat systems several times larger than those which appear in literature, albeit at a worse resolution. The multiple scattering theory leads to high-quality reconstructions. Beer s Law does only a little worse despite being applied outside its range of validity.Citation
Applied Physics Letters
Volume
82
Issue
No. 22
Pub Type
Journals
Keywords
electron microscope, multiple scattering, photonic band gap material, STEM, tomography
Citation
Issues
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Created June 1, 2003, Updated February 17, 2017