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Displaying 41251 - 41275 of 74207

A Product Information Modeling Framework For Product Lifecycle Management

June 1, 2003
Author(s)
Steven J. Fenves, Ram D. Sriram, Sudarsan Rachuri, Fujun Wang
We describe a framework for representing products based on the NIST Core Product Model (CPM) and its extensions, the Open Assembly Model (OAM), the Design-Analysis Integration model (DAIM), and the Product Family Evolution Model (PFEM). These are abstract

A Survey of Design ? Analysis Integration Issues

June 1, 2003
Author(s)
Greg Mocko, Steven J. Fenves
The report constitutes a survey of work directed towards the emergence of next-generation product development tools, specifically in the area of design-analysis integration. The report is organized into two main areas: (1) an examination of issues

Absolute Alignment of the Reference Retroreflectometer at NIST

June 1, 2003
Author(s)
Carl C. Miller
The National Cooperative Highway Research Program (NCHRP Project 05-16) awarded The National Institute of Standards and Technology (NIST) a contract to develop a dedicated reference instrument for measuring retroreflective materials, and a calibration

An Experimental Method for Measuring Mechanical Properties of Rat Pulmonary Arteries Verified With Latex

June 1, 2003
Author(s)
Elizabeth S. Drexler, Andrew J. Slifka, J Wright, Christopher N. McCowan, Dudley Finch, Timothy P. Quinn, J D. McCloskey, Dunbar Ivy, Robin Shandas
A study of the biomechanics and hemodynamics of pulmonary hypertension is incomplete without including mechanical properties data comparing healthy and diseased arterial tissue. In the initial stabe of this study, Sprague-Dawley rats will be induced with

An Interface Data Model Supporting Manufacturing Simulation

June 1, 2003
Author(s)
Yung-Tsun Lee, Yan Luo, Charles R. McLean
Simulation technology is underutilized by the manufacturing industry. Standard data interfaces, among simulation modules or between simulation and other software applications, could make information sharing effective and efficient, and hence promote

An Open Framework for the Assembly of Micro- and Nano-Scale Artifacts

June 1, 2003
Author(s)
Shaw C. Feng, Yung-Tsun Lee, Kevin W. Lyons
The design and manufacture of miniature devices have been increasing in both research laboratories and industry. The sizes of the devices continue to decrease to the nanometer scale. At the same time, the complexity of those devices has increased. To

Assembly Simulation in the Design Process in a Distributed Environment

June 1, 2003
Author(s)
Charles R. McLean, Deogratias Kibira, William Reiter, Paul Maropoulos
Simulation technology i s applicable across a distributed enterprise in the pursuit of bringing high quality products to the market in minimum time. The proliferation of computing technology and software applications now makes simulations available to many

ASSET: Security Assessment Tool for Federal Agencies

June 1, 2003
Author(s)
Elizabeth B. Lennon
This ITL Bulletin describes the features and capabilities of the Automated Security Self-Evaluation Tool (ASSET), ITL's governmentwide IT security assessment tool. ASSET automates the completion of the security questionnaire in NIST Special Publication 800

Banishing Quasiparticles From Josephson-Junction Qubits: Why and How To Do It

June 1, 2003
Author(s)
Kristine Lang, Sae Woo Nam, Joe Aumentado, John M. Martinis, C Urbina
Current-biased Josephson junctions are prime candidates for the implementation of quantum bits; however, a present limitation is their coherence time. In this paper we qualitatively describe the role of quasiparticles in decoherence. We discuss two methods

BFRL Publications, 2002

June 1, 2003
Author(s)
Star R. Burgess, Kathleen C. Whisner, Glenn P. Forney, Paul A. Reneke
Welcome to BFRL Publications, 2002. These two CD-ROMs contain publications produced by BFRL staff, publications resulting from contracts or grants with BFRL and publications contained in poceedings from BFRL sponsored conferences orworkshops. The Volume 1

C 4 F 6 1,3 Hexafluorobutadiene - A New Etching Gas: Studies on Material Compatibility, Behavior in Inductively Coupled Plasma and Etch Processes Performance

June 1, 2003
Author(s)
A Nicoletti, P Srinivasan, M Riva, Eric C. Benck, A N. Goyette, Yicheng Wang, J M. Kim, P Hsieh, A Athayde, Abhay Joshi
Hexafluoro-1,3-butadiene (C 4F 6) is a relatively new etch gas for the manufacturing of semiconductor devices, especially in critical etch processes that need high aspect ratios and selectivity. It is able to combine very high performance with a benign

Cold Discharge of CF 3 I in a Simulated Aircraft Engine Nacelle

June 1, 2003
Author(s)
Jiann C. Yang, Samuel L. Manzello, Marc R. Nyden, M D. Connaghan
An aircraft engine nacelle simulator was built to study the dispersion behavior of CF3I, a potential halon 1301 (CF3Br) replacement, at an extremely cold temperature (nominally 40 C). The experimental fixture consists of a simulated engine nacelle with

Comparative Studies of MgB 2 /Mg Nano-Composites and Press-Sintered MgB 2 Pellets

June 1, 2003
Author(s)
Q Li, L Wu, Y Zhu, A R. Moodenbaugh, G Gu, M Suenaga, Z X. Ye, Daniel A. Fischer
We present our studies of superconducting and microstructural properties of bulk MgB 2/Mg nano-composites and press-sintered MgB 2. TEM investigation revealed that the composites are very dense, consisting of nano-sized MgB 2 grains connected by the well

Control of Coherent Light and its Broad Applications

June 1, 2003
Author(s)
Jun Ye, R J. Jones, K W. Holman, S M. Foreman, D J. Jones, S T. Cundiff, John L. Hall, T M. Fortier, A Marian
A remarkable synergy has been formed between the technology of precision optical frequency metrology and ultrafast laser science. This has resulted in control of the frequency spectrum produced by mode-locked lasers,which consists of a regular comb of

Dependence of Electron Density on Fermi Energy in N-Type Gallium Antimonide

June 1, 2003
Author(s)
H S. Bennett, Howard Hung
The majority electron density as a function of the Fermi energy is calculated in Zinc Blende, n-type GaSb for donor densities between 10 16 cm -3 and 10 19 cm -3. These calculations solve the charge neutrality equation self-consistently for a four-band
Displaying 41251 - 41275 of 74207
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