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Search Publications

NIST Authors in Bold

Displaying 41076 - 41100 of 73697

A Primary Dead-Weight Tester for Pressures (0.05-1.0) MPa

April 1, 2003
Author(s)
K. Jain, Walter J. Bowers Jr., James W. Schmidt
Recent advances in technology on two fronts, 1) the fabrication of large diameter pistons and cylinders with good geometry, and 2) the ability to measure the dimensions of these components with high accuracy, have allowed dead-weight testers at NIST to

A Statistical Model for Cladding Diameter of Optical Fibers

April 1, 2003
Author(s)
Chih-Ming Wang, Timothy J. Drapela
The National Institute of Standards and Technology has developed a contact micrometer for accurate measurement of optical-fiber outer diameter. The contact micrometer is used to measure reference fibers which are artifacts used by the telecommunications

A statistical model for cladding diameter of optical fibres

April 1, 2003
Author(s)
C. M. Wang, Timothy J. Drapela
The National Institute of Standards and Technology has developed a contact micrometer for accurate measurement of the outer diameter of optical fibres. The contact micrometer is used to measure reference fibres that are artefacts used by the

AC Josephson Voltage Standard Error Measurements and Analysis

April 1, 2003
Author(s)
Charles J. Burroughs, Samuel Benz, Paul Dresselhaus
The Josephson arbitrary waveform synthesizer can be used as a precision voltage source for both ac and dc signals. Recent improvements in circuit designs have resulted in output voltages greater than 100 mVrms so that we can investigate ac metrology

Accelerator Aging Effects During Copper Electrodeposition

April 1, 2003
Author(s)
Thomas P. Moffat, B C. Baker, Daniel Wheeler, Daniel Josell
Slow sweep rate voltammetric analysis of the Cu/Cu(II) deposition reaction is shown to be an effective tool for examining aging effects associated with thiol and disulfide additives that are widely employed as brighteners. Sulfonate-terminated short chain

Amphiphobic Carbon Nanotubes as Macroemulsion Surfactants

April 1, 2003
Author(s)
Haonan Wang, Erik K. Hobbie
Single-walled carbon nanotubes (SWNTs) are insoluble in either water or oil. When mixtures of SWNTs, water, and toluene are sheared rigorously, a macroscopic emulsion ofwater droplets form in toluene with SWNTs residing at interfaces between water and

An AC Josephson Source for Johnson Noise Thermometry

April 1, 2003
Author(s)
Samuel Benz, John M. Martinis, Paul Dresselhaus, Sae Woo Nam
We have adapted the Josephson arbitrary waveform synthesizer to create a quantized voltage noise source suitable for calibrating the cross-correlation electronics of a Johnson noise thermometer system. The requirements of long term stability and low

Application of CFD Modeling to Room Fire Growth on Walls.

April 1, 2003
Author(s)
K M. Liang, T Ma, J G. Quintiere, D Rouson
An evaluation of the NIST FDS model was conducted with particular attention for its use in predicting flame spread on surfaces. Over the course of this investigation the computational model changed from combustion depicted by particles to a mixture

Artificial Neural Networks Methods Applied to Conductometric Microhotplate Data for the Identification of the Type and Relative Concentration of Chemical Warfare Agents

April 1, 2003
Author(s)
Zvi Boger, Douglas C. Meier, Richard E. Cavicchi, Stephen Semancik
Response data from microhotplate (MHP) sensor arrays were measured for various chemical warfare (CW) agents at several concentrations. Efficient large-scale artificial neural networks (ANN) modeling has been evaluated as a method for the classification and

Asymptotic Properties of Self-Energy Coefficients

April 1, 2003
Author(s)
U Jentschura, E O. LeBigot, Peter J. Mohr, Paul Indelicato, G Soff
We investigate the asymptotic properties of higher-order binding corrections to the one-loop self energy of excited states in atomic hydrogen. We evaluate the historically problematic A 60 coefficient for all P states with principal quantum numbers n {less

Calibrated Measurement of Optoelectronic Frequency Response

April 1, 2003
Author(s)
Paul D. Hale, Dylan Williams
We describe a straightforward method for accurately measuring the frequency response of optoelectronic devices. The method uses a calibrated optical reference receiver, a modulated optical source, and a calibrated electrical vector network analyzer.

CCEM-K2 Key Comparison of 10 Mohm and 1 Gohm Resistance Standards

April 1, 2003
Author(s)
Dean G. Jarrett, Ronald F. Dziuba
An international comparison of dc resistance at 10 Mohm and 1 Gohm was organized under the auspices of the Consultative Committee for Electricity and Magnetism (CCEM) and piloted by the National Institute of Standards and Technology (NIST) with 14 other

Characterization of an Ellipsoidal Radiometer

April 1, 2003
Author(s)
A V. Murthy, I Wetterlund, D P. DeWitt
An ellipsoidal radiometer, under development by Nils-Erik Gunners in close cooperation with the SP Swedish National Testing and Research Institute, has been characterized using, a 25 mm variable-temperature blackbodv as a radiant source. This radiometer is

Characterization of Binary Josephson Series Arrays of Different Types at BNM-LNE and Comparisons with Conventional SIS Arrays

April 1, 2003
Author(s)
Jean-Pierre Lo-Hive, Sophie Djordjevic, Phillippe Cancela, Francois P. Piquemal, Ralf Behr, Charles J. Burroughs, H. Seppa
Three 1-V binary Josephson arrays developed by the NIST, the PTB, and the VTT, and using, respectively, superconductor-normal metal-superconductor (SNS), superconductor-insulator-normal metal-insulator-superconductor (SINIS), and externally shunted

Characterization of Nanoporous Low-k Thin Films by Contrast Match SANS

April 1, 2003
Author(s)
R C. Hedden, Barry J. Bauer, Hae-Jeong Lee
Small-angle neutron scattering (SANS) contrast variation is used to characterize matrix properties and pore size in nanoporous low-k thin films. Using a vapor adsorption technique, SANS measurements are used to identify a contrast match solvent mixture

Choosing a Cantilever for In Situ Atomic Force Microscopy

April 1, 2003
Author(s)
John T. Woodward IV
This manuscript is a non-peer reviewed, invited tutorial for Microscopy Today. It describes the issues involved in choosing a cantilever for atomic force microscope (AFM) imaging under fluids. In situ AFM imaging is an increasingly popular technique for

Composite Substrate Research for Large-format HgCdTe IRFPAs

April 1, 2003
Author(s)
N. K. Dhar, Y Chen, P M. Brill, Paul M. Amirtharaj, S Velicu, P Boieriu, Anthony G. Birdwell
Research on silicon based composite substrates is being conducted at the Army Research Laboratory. These substrates can be used to deposit HgCdTe alloys to fabricate large-format infrared photodetector arrays. Traditionally, composite structures are
Displaying 41076 - 41100 of 73697
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