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Choosing a Cantilever for In Situ Atomic Force Microscopy

Published

Author(s)

John T. Woodward IV

Abstract

This manuscript is a non-peer reviewed, invited tutorial for Microscopy Today. It describes the issues involved in choosing a cantilever for atomic force microscope (AFM) imaging under fluids. In situ AFM imaging is an increasingly popular technique for imaging biological samples in their native environments. The desirable characteristics of the cantilever's spring constant, resonance frequency and quality factor are explained. The cantilever is modeled as a damped, driven, harmonic oscillator to explicate the relationship between these parameters and how they influence image quality.
Citation
Microscopy Today

Keywords

AFM, atomic force microscopy, in situ imaging, microcantilever

Citation

Woodward, J. (2003), Choosing a Cantilever for In Situ Atomic Force Microscopy, Microscopy Today (Accessed June 19, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created April 1, 2003, Updated February 19, 2017