Jarrett, D.
and Dziuba, R.
(2003),
CCEM-K2 Key Comparison of 10 Mohm and 1 Gohm Resistance Standards, IEEE Transactions on Instrumentation and Measurement, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=30099
(Accessed December 3, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
CCEM-K2 Key Comparison of 10 Mohm and 1 Gohm Resistance Standards
Published
Author(s)
, Ronald F. Dziuba
Abstract
An international comparison of dc resistance at 10 Mohm and 1 Gohm was organized under the auspices of the Consultative Committee for Electricity and Magnetism (CCEM) and piloted by the National Institute of Standards and Technology (NIST) with 14 other national metrology institutes (NMIs) participating. The transport standards were measured by the participating NMIs during a three-and-a-half year period beginning August 1996 and concluding March 2000. The transport standards used for this comparison were a set of three wirewound 10 Mohm standard resistors and three film-type 1 Gohm standards resistors, all packaged at NIST for this key comparison. The comparison has demonstrated that all participating NMIs agree with the key comparison reference value (KCRV) at 10 Mohm and 1 Gohm within the 95% confidence level, and most NMIs agree within the 99% confidence level.Citation
IEEE Transactions on Instrumentation and Measurement
Volume
52
Issue
2
Pub Type
Journals
Download Paper
Keywords
bridge, measurement, national metrology institute, pilot laboratory, reference value, standard resistor, transport standard, uncertainty, key comparison
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created April 1, 2003, Updated January 27, 2020