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NIST Authors in Bold

Displaying 40501 - 40525 of 73963

Information-Based Intelligent Unmanned Ground Vehicle Navigation

October 1, 2003
Author(s)
Rajmohan Madhavan, Elena R. Messina
Sensor-centric navigation of Unmanned Ground Vehicles (UGVs) operating in rugged and expansive terrains requires the competency to evaluate the utility of sensor information such that it results in intelligent behavior of the vehicles. In this paper, we

Kinematics of the Sagittarius B2(N-LMH) Molecular Core

October 1, 2003
Author(s)
J M. Hollis, J A. Pedelty, D A. Boboltz, S Y. Liu, Lewis E. Snyder, Patrick Palmer, Francis J. Lovas, P R. Jewell
Ethyl cyanide (CH3CH2CN) emission and absorption have been imaged with the Very Large Array toward Sagittarius B2(N-LMH) by means of the 5(15)-4(14) rotational transition at 43.5 GHz (lambda similar to mm). The 1.5 x 1.4 VLA beam shows two principal

Manufacturing Data Validation Through Simulation

October 1, 2003
Author(s)
Guodong Shao, Yung-Tsun Lee, Charles R. McLean
In order to ensure that the process plan and numerical control (NC) programs are complete and correct before jobs are released to the shop floor, manufacturing industry needs a validation system that has visualization and analysis capabilities. A prototype

Nanocrystal Molecules and Chains

October 1, 2003
Author(s)
J F. Diaz, W Jaskolski, J Planelles, Javier Aizpurua, Garnett W. Bryant
The electron energy structure of linear artificial molecules and one-dimensional chains formed of spherical semiconductor nanocrystals is investigated with and without and applied magnetic field. Both uniform and multilayer nanocrystals are studied. The

National Software Reference Library (NSRL)

October 1, 2003
Author(s)
Barbara Guttman
The National Software Reference Library (NSRL) of the U.S. National Institute of Standards and Technology (NIST) collects software from various sources and publishes file profiles computed from this software (such as MD5 and SHA-1 hashes) as a Reference

NIST/HL7 Experimental Registry

October 1, 2003
Author(s)
Lisa J. Carnahan
The National Software Reference Library (NSRL) of the U.S. National Institute of Standards and Technology (NIST) collects software from various sources and publishes file profiles computed from this software (such as MD5 and SHA-1 hashes) as a Reference

NOT (Faster Implementation ==> Better Algorithm), A Case Study

October 1, 2003
Author(s)
Stephen B. Balakirsky, Thomas R. Kramer
Given two algorithms that perform the same task, one may ask which is better. One simple answer is that the algorithm that delivers the best answer is the better algorithm. But what if both algorithms deliver results of similar quality? In this case, a

OASIS IIC ebXML Test Framework

October 1, 2003
Author(s)
Michael J. Kass
The National Software Reference Library (NSRL) of the U.S. National Institute of Standards and Technology (NIST) collects software from various sources and publishes file profiles computed from this software (such as MD5 and SHA-1 hashes) as a Reference

Optical-Fiber Power Meter Comparison between NIST and PTB

October 1, 2003
Author(s)
Igor Vayshenker, Holger Haars, Xiaoyu X. Li, John H. Lehman, David J. Livigni
We describe the results of a comparison of reference standards between the National Institute of Standards and Technology (NIST-USA) and Physikalisch-Technische Bundesanstalt (PTB-Germany) at nominal wavelengths of 1300 and 1550 nm using an optical-fiber

Proceedings of the LADAR Calibration Facility Workshop, June 12-13, 2003

October 1, 2003
Author(s)
Geraldine S. Cheok
The use and scope of LADAR applications continues to expand as the technology matures, but standard protocols or procedures for calibrating and testing of LADARs have yet to be developed. While selections of LADAR instruments are generally based on the

Radiative Heat Flux Measurement Uncertainty

October 1, 2003
Author(s)
Rodney A. Bryant, C A. Womeldorf, Erik L. Johnsson, Thomas J. Ohlemiller
As part of an effort to characterize the uncertainties associated with heat flux measurements in a fire environment, an uncertainty analysis example was performed using measurement data from a room corner surface products test that followed the guidelines

Recent Progress in Polarization Mode Dispersion Measurement

October 1, 2003
Author(s)
Kent B. Rochford, Paul Leo, D Peterson, Paul A. Williams
Measurement of polarization mode dispersion (PMD) spans from precise component characterization of differential group delay (DGD) to system characterization of mean DGD and dynamic PMD properties. We describe recent advances and issues in these varied

Registration of Range Data from Unmanned Aerial and Ground Vehicles

October 1, 2003
Author(s)
Anthony J. Downs, Rajmohan Madhavan, Tsai Hong Hong
In the research reported in this paper, we propose to overcome the unavailability of GPS using combined information obtained froma scanning LADARrangefinder on an Unmanned Ground Vehicle (UGV) and a LADAR mounted on an Unmanned Aerial Vehicle (UAV) that

Sources of Uncertainty in the Nose-to-Nose Sampler Calibration Method

October 1, 2003
Author(s)
Nicholas Paulter, Donald R. Larson
We analyze the nose-to-nose (ntn) method for use as an accurate sampler calibration method. The variations in the measurement of the sampler impulse response using the ntn method are presented, and the validity of the assertion that the kick-out pulse is

Space-Scale Analysis of Line Edge Roughness on 193 nm Lithography Test Structures

October 1, 2003
Author(s)
Ndubuisi G. Orji, Jayaraman Raja, Theodore V. Vorburger, Xiaohong Gu
Line edge roughness (LER) is a potential showstopper for the semiconductor industry. As the width of patterned line structures decreases, LER is becoming a non-negligible contributor to resist critical dimension (CD) variation. The International Technology
Displaying 40501 - 40525 of 73963
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