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Displaying 40151 - 40175 of 74197

New Application of Variable-Pressure/Environmental Microscopy to Semiconductor Inspection and Metrology

January 1, 2004

Author(s)

Michael T. Postek, Andras Vladar

Variable-pressure/environmental scanning electron microscopy has been used for successful investigation binary and phase-shifting chromium on quartz optical photomasks. This methodology was also applied to patterned 193 nm photoresist structures. The

New Thermal Neutron Prompt G-Ray Activation Analysis Instrument at the National Institute of Standards And Technology Center For Neutron Research

January 1, 2004

Author(s)

E A. Mackey, D L. Anderson, P J. Liposky, R M. Lindstrom, Heather H. Chen-Mayer, G P. Lamaze

Next Generation Fire Suppression technology Progam (NGP)

January 1, 2004

Author(s)

Richard G. Gann

Next generation fire suppression technology program ::FY2004 progress

January 1, 2004

Author(s)

Richard G Gann

Next Generation Fire Suppression Technology Program (NPG)

January 1, 2004

Author(s)

Richard G. Gann

NIST and OP GPS Receiver Calibrations Spanning Twenty Years: 1983-2003

January 1, 2004

Author(s)

Marc A. Weiss, Victor S. Zhang, W Lewandowski, P Uhrich, D Valat

NIST Facility for Total Spectral Radiant Flux Calibration

January 1, 2004

Author(s)

Yoshihiro Ohno, Yuqin Zong

NIST Handbook 130: Uniform Laws and Regulations in the Areas of Legal Metrology and Engine Fuel Quality (2005 Ed.)

January 1, 2004

Author(s)

Tom Coleman, Linda Crown, Kathryn Dresser

NIST Handbook 44: Specifications, Tolerances, and Other Technical Requirements for Weighing and Measuring Devices (2005 Ed.)

January 1, 2004

Author(s)

Tina Butcher, Juana Williams

NIST measurement services ::alpha-particle calibrations (2004)

January 1, 2004

Author(s)

J M R Hutchinson

NIST measurement services ::gas flowmeter calibrations with the 34 L and 677 L PVTt standards

January 1, 2004

Author(s)

John D Wright, Aaron N Johnson, Michael R Moldover, Gina M Kline

NIST recommended practice guide ::stopwatch and timer calibrations (2004 edition)/

January 1, 2004

Author(s)

Robert M Graham, Jeff C Gust

NIST recommended practice guide:pre characterization in low-k dielectric films using x-ray reflectivitiy

January 1, 2004

Author(s)

Hae-Jeong Lee, Wen-li Wu, Christopher L Soles

NIST Recommended Rest Frequencies for Observed Interstellar Molecular Microwave Transitions-- 2002 Revision

January 1, 2004

Author(s)

Francis J. Lovas

NIST Standard Reference Materials catalog January 2004:

January 1, 2004

Author(s)

Joylene W L Thomas, Yvonne A Branden, Robbin D Howard

NIST time and frequency bulletin, no. 553:

January 1, 2004

Author(s)

Eyvon M Petty

NIST time and frequency bulletin, no. 554:

January 1, 2004

Author(s)

Eyvon M Petty

NIST time and frequency bulletin, no. 555:

January 1, 2004

Author(s)

Eyvon M Petty

NIST time and frequency bulletin, no. 556:

January 1, 2004

Author(s)

Eyvon M Petty

NIST time and frequency bulletin, no. 557:

January 1, 2004

Author(s)

Eyvon M Petty

NIST time and frequency bulletin, no. 558:

January 1, 2004

Author(s)

Eyvon M Petty

NIST time and frequency bulletin, no. 559:

January 1, 2004

Author(s)

Eyvon M Petty

NIST time and frequency bulletin, no. 560:

January 1, 2004

Author(s)

Eyvon M Petty

NIST time and frequency bulletin, no. 561:

January 1, 2004

Author(s)

Eyvon M Petty

NIST time and frequency bulletin, no. 562:

January 1, 2004

Author(s)

Eyvon M Petty

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