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Displaying 37051 - 37075 of 74045

Liquid-state NMR Simulations of Quantum Many-body Problems

April 1, 2005
Author(s)
C. Negrevergne, Rolando Somma, Gerardo Ortiz, Emanuel Knill, R. Laflamme
The n-qubit concurrence canonical decomposition (CCD) is a generalization of the two-qubit canonical decomposition SU(4)=[SU(2) (x) SU(2)] ? [SU(2) (x) SU(2)], where ? is the commutative group which phases the maximally entangled Bell basis. A prequel

Magnetic Method to Characterize the Current Densities in a Breaker Arc

April 1, 2005
Author(s)
Nadia Machkour-Deshayes
The purpose of this research was to use magnetic induction measurements from a low voltage electric arc, to reconstruct the arc''s current density. The measurements were made using Hall effect sensors, which were placed close to, but outside the breaking

Manipulating Cell Adhesion on Gradient Poly(2-Hydroxyethyl Methacrylate)-Grafted Surfaces

April 1, 2005
Author(s)
Ying Mei, Tao Wu, Chang Xu, K J. Langenbach, John T. Elliott, B D. Vogt, Kathryn L. Beers, Eric J. Amis, N Washburn
In this study, a simple and versatile method was developed to prepare the low grafting density initaitor gradient, which was combined with surface initiated atom transfer radical polymerizations (ATRP) to produce a well defined poly(2-hydroxyethyl

Mechanisms of Osteoblast Adhesion on 3D Polymer Scaffolds Made by Rapid Prototyping

April 1, 2005
Author(s)
T DuttaRoy, Francis W. Wang, J J. Stone, E H. Cho, S J. Lockett
In this study, we looked at the adhesion of osteoblasts on 3D polycaprolactone (PCL) scaffolds compared to 2D PCL films and glass coverlsips. This adhesion was quantified after 24 hours by staining for vinculin, a marker of cell-substrate adhesion, and

Microfluidic Platform for the Generation of Organic-Phase Microreactors

April 1, 2005
Author(s)
Zuzanna T. Cygan, J Cabral, Kathryn L. Beers, Eric J. Amis
Rapid prototyping photolithography of a thiolene based resin was used to fabricate microfluidic devices stable to aliphatic and aromatic organic solvents. The swelling of the thiolene resin in various organic solvents was quantified and the solvent

Nanopore Formation in a Polyphenylene Low-k Dielectric

April 1, 2005
Author(s)
M S. Silverstein, Michael Shach-Caplan, Barry J. Bauer, R C. Hedden, V. J. Lee, B G. Landes
Nanometer-scale porosity is being introduced into low-k dielectrics in an attempt to achieve interlevel metal insulators with permittivities of less than 2.0. It has proven extremely difficult to describe pore formation and to characterize the porous

Optical Flatness Metrology for 300 mm Silicon Wafers

April 1, 2005
Author(s)
Ulf Griesmann, Quandou (. Wang, T D. Raymond
At the National Institute of Standards and Technology (NIST), we are developing two interferometric methods for measuring the thickness variation and flatness of free-standing and chucked silicon wafers with diameters up to 300mm. The eXtremely accurate

Performance Analysis of Exponential Backoff

April 1, 2005
Author(s)
B J. Kwak, N O. Song, Leonard E. Miller
We have implemented a quantum key distribution (QKD) system with polarization encoding at 850 nm over 1 km of optical fiber. The high-speed management of the bit-stream, generation of random numbers and processing of the sifting algorithm are all handled

Precision Measurements of AC Josephson Voltage Standard Operating Margins

April 1, 2005
Author(s)
Charles J. Burroughs, Samuel P. Benz, Paul D. Dresselhaus, Yonuk Chong
Recent advances in circuit design and fabrication of superconducting integrated circuits have enabled us to demonstrate an ac Josephson voltage standard (ACJVS) that generates both ac and dc waveforms up to 242mV peak voltage. Using a Fast Fourier

Progress on Johnson Noise Thermometry using a Quantum Voltage Noise Source for Calibration

April 1, 2005
Author(s)
Sae Woo Nam, Samuel P. Benz, Paul D. Dresselhaus, Charles J. Burroughs, Weston L. Tew, D. R. White, John M. Martinis
We describe our progress towards a high-precision measurement of temperature using Johnson noise. Using a Quantized Voltage Noise Source (QVNS) based on the Josephson effect as a calculable noise source, we have been able to measure the ratio of the

Project MESA Technical Specification Group document MESA_70.012_v1.2.1.doc

April 1, 2005
Author(s)
L T. Klein-berndt, Nader Moayeri
We have implemented a quantum key distribution (QKD) system with polarization encoding at 850 nm over 1 km of optical fiber. The high-speed management of the bit-stream, generation of random numbers and processing of the sifting algorithm are all handled

Real-time Applications for Sensor Networks

April 1, 2005
Author(s)
Hamid Gharavi
We have implemented a quantum key distribution (QKD) system with polarization encoding at 850 nm over 1 km of optical fiber. The high-speed management of the bit-stream, generation of random numbers and processing of the sifting algorithm are all handled

Redefinition of the Kilogram: A Decision Whose Time Has Come

April 1, 2005
Author(s)
I M. Mills, Peter Mohr, T J. Quinn, Barry Taylor, Edwin R. Williams
The kilogram, the base unit of mass in the International System of Units (SI), is defined as the mass m(K) of the international prototype of the kilogram. This definition has the effect of fixing the value of m(K) to be one kilogram exactly. In this paper

Refractometry Using a Helium Standard

April 1, 2005
Author(s)
Jack A. Stone Jr., Alois Stejskal
The refractive index of helium at atmospheric pressure can be calculated from first principles with a very low uncertainty, on the order of 10^-10. Furthermore, the low refractive index of helium puts minimal demands on the pressure and temperature

Scanning Electron Microscope Dimensional Metrology Using a Model-Based Library

April 1, 2005
Author(s)
John S. Villarrubia, Andras Vladar, Michael T. Postek
The semiconductor electronics industry places significant demands upon secondary electron imaging to obtain dimensional measurements that are used for process control or failure analysis. Tolerances for measurement uncertainty and repeatability are smaller

Software Assurance Metrics and Tool Evaluation (SAMATE)

April 1, 2005
Author(s)
Michael J. Kass
The National Software Reference Library (NSRL) of the U.S. National Institute of Standards and Technology (NIST) collects software from various sources and publishes file profiles computed from this software (such as MD5 and SHA-1 hashes) as a Reference

Stabilized frequency comb with a self-referenced femtosecond Cr:forsterite laser

April 1, 2005
Author(s)
Kyoungsik Kim, Brian R. Washburn, G Wilpers, Christopher W. Oates, Leo W. Hollberg, Nathan R. Newbury, Scott A. Diddams, Jeffrey W. Nicholson, M. F. Yan
A frequency comb is generated with a Cr:forsterite femtosecond laser, spectrally broadened through a highly nonlinear optical fiber to span from 1.0 υm to 2.2 υm, and stabilized using the f-to-2f self-referencing technique. The repetition rate and the
Displaying 37051 - 37075 of 74045
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