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NIST Authors in Bold

Displaying 36851 - 36875 of 73929

Importance of Display Metrology in a Competitive World

April 26, 2005
Author(s)
Edward F. Kelley
How do contrast, brightness, viewing angle, and other parameters affect the quality of a display? Do the specifications always tell you what you want to know? Is specsmanship a problem? Why is a solid bedrock of display metrology important for the highly

Pump-probe Faraday rotation magnetometer using two diode lasers

April 26, 2005
Author(s)
Forrest T. Charnock, Radek Lopusnik, Thomas J. Silva
A time-resolved Faraday rotation magnetometer using externally triggered pulsed diode lasers is described. This device permits measurement of the dynamic properties of polarized electronic spins in semiconductors. A non- equilibrium spin polarization is

Optical frequency / wavelentgh references

April 25, 2005
Author(s)
Leo W. Hollberg, Christopher W. Oates, G Wilpers, C Hoyt, Zeb Barber, Scott A. Diddams, W Oskay, James C. Bergquist
Ideas for using visible light from atomic transitions for precision instrumentation and metrology go back at least to the 1800's. There are several good reasons to use optical frequencies, and with the scientific and technological advances of the last

Mobility Open Architecture Simulation and Tools Environment

April 21, 2005
Author(s)
Stephen B. Balakirsky, Christopher J. Scrapper Jr, Elena R. Messina
This paper will describe the Mobility Open Architecture Tools and Simulation (MOAST) environment. This environment conforms to the NIST 4D/RCS architecture [3] and allows simulated and real architectural components to function seamlessly in the same system

The Contribution of HfO2 Bulk Oxide Traps to Dynamic NBTI in pMOSFETs

April 20, 2005
Author(s)
Baozhong Zhu, John S. Suehle, Eric M. Vogel, Joseph B. Berstein
NBTI of HfO2 and SiO2 devices are studied and compared. The pulsed stress frequency responses of DVth and acceleration parameters are quite different for them. Bulk traps in the HfO2 film are used to explain these differences. Furthermore, caution must be

Comparison of SEM and HRTEM CD-Measurements Extracted from Monocrystalline Tes-Structures Having Feature Linewidths from 40 nm to 240 nm

April 18, 2005
Author(s)
Michael W. Cresswell, Brandon Park, Richard A. Allen, William F. Guthrie, Ronald G. Dixson, Wei Tan, Christine E. Murabito
CD measurements have been extracted from SEM and HRTEM images of the same set of monocrystalline silicon features having linewidths between 40 and 200 nm. The silicon features are incorporated into a new test structure which has been designed to facilitate

Laser Cooling Transitions in Atomic Erbium

April 18, 2005
Author(s)
H Ban, M Jacka, James L. Hanssen, Joseph Reader, Jabez J. McClelland
We discuss laser cooling opportunities in atomic erbium, identifying five J rarr} J + 1 transitions from the 4f 126s 2 3H 6 ground state that are accessible to common visible and near-infrared continuous-wave tunable lasers. We present lifetime

Nanometrology - FY 2004 Programs and Selected Accomplishments

April 15, 2005
Author(s)
C M. Allocca
The MSEL Nanometrology Program incorporates basic measurement metrologies to determine material properties, process monitoring at the nanoscale, nano-manufacturing and fabrication techniques, and structural characterization and analysis techniques, such as

Network Transfer of Control Data: An Application of the NIST Smart Data Flow

April 15, 2005
Author(s)
Martial Michel, Vincent M. Stanford, O P. Galibert
Pervasive Computing environments range from basic mobile point of sale terminal systems, to rich Smart Spaces with many devices and sensors such as lapel microphones, audio and video sensor arrays and multiple interactive PDA acting as electronic brief

Surface Engineering Measurement Standards for Inorganic Materials

April 14, 2005
Author(s)
S J. Dapkunas
The Recommended Practice Guide describes nearly 200 standard measurement methods (standards) used by the surface engineering community. The standards compiled address inorganic (metal and ceramic) materials used in structural applications. The Guide is

TRC Thermodynamic Tables - Hydrocarbons, Supplement 129, 2005

April 11, 2005
Author(s)
Michael D. Frenkel
1. Table 23-2-(1.21170)-db - Page db-1696.0 New table for 2,2,4,4,6,8,8-heptamethylnonane containing the density for the real fluid at selected temperatures and pressures. 2. Table 23-2-(1.12410)-db - Pages db-1720.0 and db-1720.1 New tables for nonadecane

Application of Combinatorial Methods for the Testing of Adhesives

April 10, 2005
Author(s)
Christopher M. Stafford
This presentation will focus on the development and application of novel high-throughput platforms for both adhesion and mechanical property testing. For screening of commercial pressure sensitive adhesives, we are applying C&HT tools to conventional peel
Displaying 36851 - 36875 of 73929
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