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NIST Optoelectronic Measurements for Fiber Optic Applications

Published

Author(s)

Kent B. Rochford, Paul D. Hale, Nathan R. Newbury

Abstract

We describe current measurement capabilities as well as research focused on two areas: improving temporal and frequency response characterization of detectors and instrumentation using electro-optic sampling, and improving wavelength metrology using frequency combs.
Proceedings Title
Tech. Dig., Optical Fiber Communication Conf. (OFC)
Conference Dates
March 6-11, 2005
Conference Location
Anaheim, CA, USA

Keywords

detectors, frequency combs, frequency response, optical fiber metrology, wavelength metrology

Citation

Rochford, K. , Hale, P. and Newbury, N. (2005), NIST Optoelectronic Measurements for Fiber Optic Applications, Tech. Dig., Optical Fiber Communication Conf. (OFC), Anaheim, CA, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31792 (Accessed June 12, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created February 28, 2005, Updated October 12, 2021