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NIST Optoelectronic Measurements for Fiber Optic Applications
Published
Author(s)
Kent B. Rochford, Paul D. Hale, Nathan R. Newbury
Abstract
We describe current measurement capabilities as well as research focused on two areas: improving temporal and frequency response characterization of detectors and instrumentation using electro-optic sampling, and improving wavelength metrology using frequency combs.
Proceedings Title
Tech. Dig., Optical Fiber Communication Conf. (OFC)
detectors, frequency combs, frequency response, optical fiber metrology, wavelength metrology
Citation
Rochford, K.
, Hale, P.
and Newbury, N.
(2005),
NIST Optoelectronic Measurements for Fiber Optic Applications, Tech. Dig., Optical Fiber Communication Conf. (OFC), Anaheim, CA, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31792
(Accessed October 13, 2025)