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NIST Authors in Bold

Displaying 36601 - 36625 of 73697

Origin of Exchange Decoupling Effects in High-Coercivity Air-Annealed CoPd Multilayers

May 1, 2005
Author(s)
William F. Egelhoff Jr., Robert McMichael, J Mallett, Alexander J. Shapiro, Cedric J. Powell, John E. Bonevich, J H. Judy, J H. Thomas, Erik B. Svedberg
We have achieved excellent exchange decoupling of grains in CoPd multilayers by annealing in air at 300 C. Samples exhibit a slope in the hysteresis loop close to 1.0, nucleation fields as large as 1.1 T, and coercivities as large as 1.6 T. These are among

Propagation and Detection of Radio Signals Before, During, and After the Implosion of a 13-Story Apartment Building

May 1, 2005
Author(s)
Christopher L. Holloway, Galen H. Koepke, Dennis G. Camell, Catherine A. Remley, Dylan F. Williams, Susan A. Schima, Seturnino Canales, Douglas T. Tamura
In this report we investigate communications problems faced by emergency responders (firefighters and police) in disaster situations (i.e., collapsed buildings). A fundamental challenge to communications into large building structures is the strong

PSL: A Semantic Domain for Flow Models

May 1, 2005
Author(s)
Conrad Bock, Michael Gruninger
Flow models underlie popular programming languages and many graphical behavior specification tools. However, their semantics is typically ambiguous, causing miscommunication between modelers and unexpected implementation results. This article introduces a

Results From the NIST 2004 DNA Quantitation Study

May 1, 2005
Author(s)
Margaret C. Kline, David L. Duewer, Janette W. Redman, John M. Butler
For optimal DNA Short Tandem Repeat (STR) typing results, the DNA concentration ([DNA]) of the sample must be accurately determined prior to the polymerase chain reaction (PCR) amplification step in the typing process. In early 2004, the National Institute

Second Primages on n-bit Hash Functions for Much Less than 2n Work

May 1, 2005
Author(s)
John M. Kelsey, B Schneier
We expand a previous result of Dean[Dea99] to provide a second preimage attack on all n-bit iterated hash functions with Damgard-Merkle strengthening and n-bit intermediate states, allowing a second preimage to be found for a 2k-message-block message with

Storage Conditions for High-Accuracy Composition Standards of AlGaAs

May 1, 2005
Author(s)
Kristine A. Bertness, Alexana Roshko, S. E. Asher, Craig L. Perkins
AlGaAs epitaxial films were stored under different environmental conditions and the resulting surface oxidation and contamination variations measured using several analytical techniques. Auger depth profiles confirmed that oxidation and carbon

Surface Anisotropy of Permalloy in NM/NiFe/NM Multilayers

May 1, 2005
Author(s)
J O. Rantschler, P J. Chen, Anthony S. Arrott, Robert D. McMichael, William F. Egelhoff Jr., Brian B. Maranville
We have measured surface anisotropy in Permalloy (Py) deposited between two layers of normal metal (NM = Ag, Cu, or Ta) by determining the total perpendicular anisotropy using both the frequency and angular dependence of ferromagnetic resonance

Systems Engineering in the Product Lifecycle

May 1, 2005
Author(s)
Conrad E. Bock
This article introduces basic elements of systems engineering that are useful in managing the product lifecycle, as expressed in an extension to the Unified Modeling Language. Models are described for product requirements in textual and computable form

Thermodynamic Control of Germanium Quantum Dot Growth on Silicon

May 1, 2005
Author(s)
Richard J. Wagner, E Gulari
Strained epitaxial growth of Ge on Si(001) produces self-assembled, nanometer scale islands, or quantum dots. We study this growth by atomistic simulation, computing the energy of island structures to determine when and how islanding occurs. The

Unbiased Estimation of Linewidth Roughness

May 1, 2005
Author(s)
John S. Villarrubia, B Bunday
Line width roughness (LWR) is usually estimated simply as three standard deviations of the line width. The effect of image noise upon this metric includes a positive nonrandom component. The metric is therefore subject to a bias or ?systematic error? that

Uncertainty in Reference Values for the Charpy V-notch Verification Program

May 1, 2005
Author(s)
Jolene D. Splett, Chih-Ming Wang
We present a method for computing the combined standard uncertainty for reference values used in the Charpy machine verification program administered by the National Institute of Standards and Technology. The technique is compliant with the ISO GUM and

Voluntary Voting System Guidelines

May 1, 2005
Author(s)
Mark Skall
The National Software Reference Library (NSRL) of the U.S. National Institute of Standards and Technology (NIST) collects software from various sources and publishes file profiles computed from this software (such as MD5 and SHA-1 hashes) as a Reference
Displaying 36601 - 36625 of 73697
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