Hanke, M.
and Kessler, E.
(2005),
Precise Lattice Parameter Comparison of Highly Perfect Silicon Crystals, Journal of Physics D-Applied Physics
(Accessed January 22, 2025)
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Precise Lattice Parameter Comparison of Highly Perfect Silicon Crystals
Published
Author(s)
,
Citation
Journal of Physics D-Applied Physics
Volume
38
Issue
No 10A
Pub Type
Journals
Keywords
Avogadro constant, lattice spacing, x-ray diffraction
Citation
Issues
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Created May 1, 2005, Updated February 17, 2017