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Uncertainty in Reference Values for the Charpy V-notch Verification Program



Jolene D. Splett, Chih-Ming Wang


We present a method for computing the combined standard uncertainty for reference values used in the Charpy machine verification program administered by the National Institute of Standards and Technology. The technique is compliant with the ISO GUM and models the between-machine bias using a Type B distribution. We demonstrate the method using actual data from the Charpy machine verification program.
Journal of Testing and Evaluation
34 No 3


charpy v-notch, impact certification program, impact testing, ISO GUM, notched-bar testing, reference specimens, uncertainty


Splett, J. and Wang, C. (2005), Uncertainty in Reference Values for the Charpy V-notch Verification Program, Journal of Testing and Evaluation, [online], (Accessed May 30, 2024)


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Created May 1, 2005, Updated February 19, 2017