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Uncertainty in Reference Values for the Charpy V-notch Verification Program

Published

Author(s)

Jolene D. Splett, Chih-Ming Wang

Abstract

We present a method for computing the combined standard uncertainty for reference values used in the Charpy machine verification program administered by the National Institute of Standards and Technology. The technique is compliant with the ISO GUM and models the between-machine bias using a Type B distribution. We demonstrate the method using actual data from the Charpy machine verification program.
Citation
Journal of Testing and Evaluation
Volume
34 No 3

Keywords

charpy v-notch, impact certification program, impact testing, ISO GUM, notched-bar testing, reference specimens, uncertainty

Citation

Splett, J. and Wang, C. (2005), Uncertainty in Reference Values for the Charpy V-notch Verification Program, Journal of Testing and Evaluation, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=50807 (Accessed May 30, 2024)

Issues

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Created May 1, 2005, Updated February 19, 2017