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Search Publications

NIST Authors in Bold

Displaying 36526 - 36550 of 73697

Advantages of superconducting quantum interference device-detected magnetic resonance over conventional high-frequency electron paramagnetic resonance for characterization of nanomagnetic materials

May 16, 2005
Author(s)
Brant Cage, Stephen E. Russek, David Zipse, Naresh S. Dalal
A dc-detected high-frequency electron paramagnetic resonance (HF-EPR) technique, based on a standard superconducting quantum interference device (SQUID) magnetometer, has significant advantages over traditional HF-EPR based on microwave absorption

Machining Cracks in Finished Ceramics

May 16, 2005
Author(s)
George D. Quinn, L K. Ives, S Jahanmir
Well prepared strength test specimens and components break from a material s inherent flaws and machining damage has no effect on strength. On the other hand, grinding can create machining flaws that control strength and limit the performance of finished

Third Japan-US Workshop on Combinatorial Material Science and Technology

May 16, 2005
Author(s)
Winnie K. Wong-Ng
The Third Japan-US workshop on Combinatorial Material Science and Technology took place at the Loisir Hotel in Naha City on the historical island, Okinawa, Japan, from December 7 to December 10, 2004. This workshop was the third of a series of Japan-US

Current-induced switching in a single exchange-biased ferromagnetic layer

May 15, 2005
Author(s)
Tingyong Chen, Yi Ji, C Chien, Mark D. Stiles
We demonstrate current-induced switching effects in a single exchanged-biased ferromagnetic layer. A nanodomain can be switched within the ferromagnetic layer by a spin polarized current injected through a point contact. The high resistance of the

Magnetic normal modes of nano-elements

May 15, 2005
Author(s)
Robert McMichael, Mark D. Stiles
Micromagnetic calculations are used to determine the eigenfrequencies and precession patterns of some of the lowest-frequency magnetic normal modes of submicron patterned elements. For a Permalloy-like ellipse, 350 nm ¿ 160 nm ¿ 5 nm thick in zero field

A Flexible Bandpass Correction Method for Spectrometers

May 13, 2005
Author(s)
Yoshihiro Ohno
An improved method for the correction of bandpass errors in spectrometers has been developed. This method is an improvement over the Stearns and Stearns method, which is limited in use to a triangular bandpass function and requires the bandwidth be matched

Implementation of the semiclassical quantum Fourier transform in a scalable system

May 13, 2005
Author(s)
J Chiaverini, Joseph W. Britton, Dietrich G. Leibfried, Emanuel H. Knill, Murray D. Barrett, Brad R. Blakestad, Wayne M. Itano, John D. Jost, C. Langer, R Ozeri, Tobias Schaetz, David J. Wineland
One of the most interesting future applications of quantum computers is Shor's factoring algorithm, which provides an exponential speedup compared to known classical algorithms. The crucial final step in Shor's algorithm is the quantum Fourier transform

NIST Facility for Color Rendering Simulation

May 13, 2005
Author(s)
Wendy L. Davis, J L. Gardner, Yoshihiro Ohno
The color rendering index (CRI) does not adequately assess the color rendering properties of solid-state light sources. An improved metric will be critical to the development of such new light sources for general lighting applications. A facility for color

A Behavioral Model for Reducing the Complexity of Mixer Analysis and Design

May 11, 2005
Author(s)
Alessandro Cidronali, Giovanni Loglio, Jeffrey Jargon, Gianfranco Manes
This paper considers an approach for the behavioral modeling of the conversion mechanism in a nonlinear device suitable for the analysis of RF/microwave mixers. The core of the model consists of the conversion matrix of the nonlinear cell under

A Color Gamut Assessment Standard: An Inter-Laboratory Measurement Comparison

May 11, 2005
Author(s)
Paul A. Boynton, Libert M. John, Edward F. Kelley
In earlier papers, NIST proposed a standard illumination source and optical filter targets to with which to assess the state-of-the-art of display measurement. The Gamut Assessment Standard (GAS) was present the display metrologist with a set of

Challenges in Automotive Display Standards

May 11, 2005
Author(s)
Edward F. Kelley, Silviu Pala
We review the goals, accomplishments, and directions of the Society for Automotive Engineers (SAE) J1757 Vehicular Flat Panel Display Metrology Committee. The conditions for which a display must qualify for use in an automobile are much different than for

Display Metrology Concerns International Standards

May 11, 2005
Author(s)
Paul A. Boynton
An alphabet soup of display standards addresses the various needs and applications of display manufactures, integrators, and users. Unfortunately, when it comes to display metrology, many of these standards suffer. Assumptions are made about the

High-power nonlinearity of optical fiber power meters at 1474 nm

May 11, 2005
Author(s)
Igor Vayshenker, Ralph Swafford, Shao Yang
We have developed a system to measure the nonlinearity of optical fiber power meters (OFPMs) at a maximum power of 0.6 W at 1474 nm. The system is based on the triplet superposition method. This system measures nonlinearity of OFPMs using correction

Nonlinearity of Response of Silicon Photodiodes at 193 nm

May 11, 2005
Author(s)
Shao Yang, Darryl A. Keenan, Marla L. Dowell
We have developed a measurement system based on a correlation method to characterize the nonlinearity response of silicon photodiodes to pulsed-laser radiation at 193 nm. The method compares the pulse response of the device under test with that of a
Displaying 36526 - 36550 of 73697
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