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Displaying 34676 - 34700 of 74384

Effect of Self-Assembled Monolayer Film Order on Nanofriction

July 6, 2006
Author(s)
S Sambasivan, S Hsieh, Daniel A. Fischer, Stephen M. Hsu
Friction at the nanoscale has become a significant challenge for microsystems, including MEMS, NEMS and other devices. At nanoscale, lateral loading often causes component breakage and loss of functions in devices, therefore, accurate measurement and

Semiconductor Microelectornics and Nanoelectronics Programs

July 5, 2006
Author(s)
Stephen Knight, Joaquin (. Martinez, Michele L. Buckley
The microelectronics industry supplies vital components to the electronics industry and to the U.S. economy, enabling rapid improvements in productivity and in new high technology growth industries such as electronic commerce and biotechnology. The

Simulations of Optical Microscope Images

July 3, 2006
Author(s)
Thomas A. Germer, Egon Marx
The resolution of an optical microscope is limited by the optical wavelengths used. However, there is no fundamental limit to the sensitivity of a microscope to small differences in any of a feature's dimensions. That is, those limits are determined by

3D Molecular Imaging SIMS

July 1, 2006
Author(s)
John G. Gillen, Albert J. Fahey, M Wagner, Christine M. Mahoney
Thin monolayer and bilayer filsm of spin cast poly(methyl methacrylate) (PMMA), poly(2-hydroxyethyl methacrylate) (PHEMA), poly(lactic) acid (PLA) and PLA doped with several pharmaceuticals have been analyzed by dynamic SIMS using SF 5+ polyatomic primary

A Comprehensive Evaluation of an Outdoor Vehicular Test Range

July 1, 2006
Author(s)
Robert T. Johnk, David R. Novotny, Chriss A. Grosvenor, Nino Canales, Janalee A. Graham, Doug Martin, Scott Yencer, Donald Hibbard, Louis L. Nagy, Tyrone L. Roach
This paper describes a thorough evaluation of an outdoor automotive antenna test range. Electric-field uniformity results are generated from accurate, full-wave electromagnetic simulations of the test range. Measured electric-field results using an

Computer-Controlled Characterization of High-Voltage, High-Frequency SiC Devices

July 1, 2006
Author(s)
Jose M. Ortiz-Rodriguez, Allen R. Hefner Jr., David W. Berning, Colleen E. Hood, S. Olcum
Silicon carbide (SiC) power devices have begun to emerge recently with a performance that is superior to that of silicon power devices. Therefore, the push to higher power and higher voltage applications also comes with it. This work addresses the need for
Displaying 34676 - 34700 of 74384
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