Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Characterization of Drug-Eluting Stent (DES) Materials With Cluster Secondary Ion Mass Spectrometry (SIMS)

Published

Author(s)

Christine M. Mahoney, Martin McDermott

Abstract

Secondary Ion Mass Spectrometry (SIMS) employing an SF5+ polyatomic primary ion source was utilized to analyze several materials commonly used in drug eluting stents (DES). Poly(ethylene-co-vinyl acetate) (PEVA), Poly(lactic-co-glycolic acid) (PLGA) and various poly(urethanes) were successfully depth profiled under SF5+ bombardment. The resultant molecular depth profiles obtained from these polymeric films showed very little degradation in molecular signal as a function of increasing SF5+ primary ion dose when experiments were performed at cryogenic temperatures (signal was maintained for doses up to ~ 5 x 1015 ions/cm2). Temperature was determined to be an important parameter in both the success of the depth profiles and the mass spectral analysis of the polymers. In addition to the pristine polymer films, paclitaxel (drug released in TaxusTM stent) containing PLGA films were also characterized, where it was confirmed that both drug and polymer signals could be monitored as a function of depth at lower paclitaxel concentrations (10 wt%). This capability to monitor drug distributions as a function of depth will allow us to study the release of the drug and correlate compositional information with dissolution studies.
Citation
Applied Surface Science

Keywords

biomaterials, cluster, coronary, depth profile, DES, drug-eluting, SF5+, SIMS, stents

Citation

Mahoney, C. and McDermott, M. (2006), Characterization of Drug-Eluting Stent (DES) Materials With Cluster Secondary Ion Mass Spectrometry (SIMS), Applied Surface Science (Accessed October 15, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created July 1, 2006, Updated February 19, 2017