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Displaying 34076 - 34100 of 74175

Advanced Metrology Needs for Nanoelectronics Lithography

October 1, 2006
Author(s)
Stephen Knight, Ronald Dixon, Ronald L. Jones, Eric Lin, Ndubuisi G. Orji, Richard M. Silver, Andras Vladar, Wen-li Wu
The semiconductor industry has exploited productivity improvements through aggressive feature size reduction for over four decades. While enormous effort has been expended in developing the optical lithography tools to print ever finer features

An Optimized Electrophoresis System for Tandem SSCP and Heteroduplex Analysis of p53 Gene Exons 5-9 on Glass Microfluidic Chips

October 1, 2006
Author(s)
Christa N. Hestekin, J P. Jakupciak, Thomas N. Chiesl, C D. O'Connell, Annelise E. Barron, C W. Kan
With the sequencing of the human genome, there is a growing need for rapid and sensitive genotyping methods that can be incorporated into the clinical setting. DNA-based methods, such as single strand conformational polymorphism (SSCP) and heteroduplex

Anisotropy of Magnetization Reversal and Magnetoresistance in Square Arrays of Permalloy Nano-Rings

October 1, 2006
Author(s)
A Goncharov, A Zhukov, V Metlushko, G Bordignon, H Fangohr, C de Groot, John Unguris, Willard C. Uhlig, G Karapetrov, B Ilic, P A. de Groot
Magnetization reversal mechanisms and the impact of magnetization direction are studied in square arrays of interconnected circular permalloy nanorings using magnetooptical Kerr effect, local imaging, numerical simulations, and transport techniques

Eliminating FFT Artifacts in Vector Signal Analyzer Spectra

October 1, 2006
Author(s)
Michael McKinley, Kate Remley, M. Myslinski, J. S. Kenney
We present a method to minimize spectral leakage in measurements of periodic signals made with the vector signal analyzer (VSA) by taking into account the periodic nature of the Fast Fourier Transform (FFT). This method negates the need for filtering the

Evaluation Specimens for Izod Impact Machines (SRM 2115): Report of Analysis

October 1, 2006
Author(s)
Thomas A. Siewert, Jolene Splett, Raymond Santoyo
In the past few years, we have received a number of requests for verification specimens for Izod impact machines, similar to what we offer for Charpy impact machines. Although there are similarities between Izod and Charpy impact testing, there are some

Experimental Techniques for Low-Temperature Measurements

October 1, 2006
Author(s)
John (Jack) W. Ekin
This textbook is written for the experimentalist starting in the laboratory -- beginning graduate students, industry measurement engineers, and materials scientists interested in learning how to design successful low-temperature (1 K to 300 K) measurement

Generalized Test Bed for High-Voltage, High-Power SiC Device Characterization

October 1, 2006
Author(s)
David W. Berning, Allen R. Hefner Jr., J J. Rodriguez, Colleen E. Hood, Angel Rivera
A generalized 25 kV test bed developed to characterize high-voltage, high-power SiC devices is described. The test bed features containment of all high voltage circuits and the device under test (DUT) within a clear plastic interlocked safety box. A fast

Impulse Spectrum Amplitude Uncertainty Analysis

October 1, 2006
Author(s)
Nicholas Paulter, Donald R. Larson
A detailed uncertainty analysis for an impulse spectrum amplitude measurement system is presented. This analysis includes consideration of effects such as temperature, computation algorithms, history of instrument performance, equipment limitations, and

Integral Operators and Delay Differential Equations

October 1, 2006
Author(s)
David E. Gilsinn, Florian A. Potra
We begin this expository essay by reviewing with examples what a typical engineer already knows about statistics. We then consider a central question in engineering decision making, i.e., given a computer simulation of high-consequence systems, how do we

Interprocess Communication in the Process Specification Language

October 1, 2006
Author(s)
Conrad E. Bock
Interprocess communication is ubiquitous in modern computing, appearing most commonly as inputs, outputs, and messaging. This paper formalizes interprocess communication based on the involvement of entities in a process, and how processes determine which

Josephson Voltage Standards Comparison Between CENAM and NIST at 10 V Level

October 1, 2006
Author(s)
Dionisio Hernandez, Enrique Navarette, David Aviles, Yi-hua D. Tang
A comparison of Josephson Voltage Standards (JVS) between the National Institute of Standards and Technology (NIST) and the Centro Nacional de Metrologia (CENAM) held at CENAM from 21st to 23rd of March 2006 is reported. The comparison was made at the 10 V

Merits of PM Noise Measurement over Noise Figure: A Study at Microwave Frequencies

October 1, 2006
Author(s)
Archita Hati, David A. Howe, Fred L. Walls, D. Walker
This paper addresses two issues: (i) it compares the usefulness of phase-modulation (PM) noise measurements vs. noise figure (NF) measurements in characterizing the merit of an amplifier, and (ii) it reconciles a general misunderstanding in using ¿174 dBc
Displaying 34076 - 34100 of 74175
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