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NIST Authors in Bold

Displaying 34001 - 34025 of 74175

The Effect of Deprotection Extent on Swelling and Dissolution Regimes of Thin Polymer Films

October 28, 2006
Author(s)
Ashwin Rao, Shuhui Kang, B D. Vogt, Vivek M. Prabhu, Eric K. Lin, Wen-Li Wu, M Muthukumar
The response of unentangled polymer thin films to aqueous hydroxide solutions is measured as a function of increasing weakly-acidic methacrylic acid comonomer content produced by an in-situ reaction-diffusion process. Quartz crystal microbalance with

RFID Security: A Taxonomy of Risk

October 27, 2006
Author(s)
A Karygiannis, T. Phillips, A. Tsibertzopoulos
Radio Frequency Indentification (RFID) and other automated identification technologies (AIT) are being used by government and industry to replace barcodes and existing pen and paper processes in areas such as asset tracking, toll collection, supply chain

Accurate Modeling of Benchmark X-ray Spectra from Highly-Charged Ions of Tungsten

October 26, 2006
Author(s)
Y Ralchenko, Joseph N. Tan, John D. Gillaspy, Joshua M. Pomeroy, E Silver
We present detailed collisional-radiative modeling for the benchmark x-ray spectrum of highly-charged tungsten ions in the range between 3 \AA \ and 10 \AA produced in an Electron Beam Ion Trap (EBIT) with a beam energy of 4.08 keV. Remarkably good

High Accuracy Calibration of Photon-Counting Detectors

October 25, 2006
Author(s)
Sergey V. Polyakov, Michael Ware, Alan L. Migdall
We discuss a practical implementation of a photon-counting detector calibration using correlated photon pairs produced by parametric down-conversion. In this calibration scheme, the detection of a first photon triggers the measurement sequence aimed at

High-Frequency Metrology at NIST: Current Programs and New Directions

October 25, 2006
Author(s)
Dennis S. Friday, Ronald A. Ginley
We provide an overview of the current state of high-frequency and microwave metrology programs at NIST, as well as a discussion of recent changes, emerging needs and exploratory new directions. A brief description of each of the core microwave metrology

Modeling MEMS Microhotplate Structures With SystemC

October 25, 2006
Author(s)
Ankush Varma, Muhammad Afridi, Akin Akturk, Paul Klein, Allen R. Hefner Jr., Bruce Jacob
Designers of SoCs with non-digital components, such as analog or MEMS devices, can currently use highlevel system design languages, such as SystemC, to model only the digital parts of a system. This is a significant limitation, since it makes key system

Review of ultraviolet and high power laser measurement standards at NIST

October 25, 2006
Author(s)
John H. Lehman, Christopher L. Cromer, Shao Yang, Marla L. Dowell
High accuracy laser radiometry is on the verge of growth and improvements just as new laser technologies are evolving. Our present tasks are directed toward anticipating and meeting the measurement needs in two areas; higher power and shorter wavelengths

SIM Time and Frequency Comparison Network in Near Real Time

October 25, 2006
Author(s)
Jose M. Lopez, Michael A. Lombardi, Andrew N. Novick, Jean-Simon Boulanger, Raymond Pelletier, Carlos Donado
A network for time and frequency comparisons within the Inter-American Metrology System (SIM) has been developed. The SIM time and frequency network uses the common-view Global Positioning System (GPS) method to compare frequency and time standards

Single Photon Detector Comparison in a Quantum Key Distribution Link Testbed

October 25, 2006
Author(s)
Jonathan L. Habif, David S. Pearson, Robert Hadfield, Robert E. Schwall, Sae Woo Nam, Aaron J. Miller
We provide a direct comparison between the InGaAs avalanche photodiode (APD) and the NbN superconducting single photon detector (SSPD) for applications in fiber-based quantum cryptography. The quantum efficiency and dark count rate were measured for each

Role of Indenter Material and Size in Veneer Failure of Brittle Layer Structures

October 24, 2006
Author(s)
Sanjit Bhowmick, Juan J. Melendez-Martinez, Ilja Hermann, Yu Zhang, Brian R. Lawn
The roles of indenter material and size in the failure of brittle veneer layers in all-ceramic crown-like structures are studied. Glass veneer layers 1 mm thick bonded to alumina layers 0.5 mm thick on polycarbonate bases (representative of porcelain

Unique File Identification in the National Software Reference Library

October 24, 2006
Author(s)
Steven L. Mead
The National Software Reference Library (NSRL) provides a repository of known software, file profiles, and file signatures for use by law enforcement and other organizations involved with computer forensic investigations. This paper examines whether the

Adaptive Channel Scanning for IEEE 802.16e

October 23, 2006
Author(s)
Richard A. Rouil, Nada T. Golmie
In this article we propose an adaptive algorithm that determines the duration and frequency of channel scanning in order to facilitate the discovery of neighboring base stations and handovers across multiple IEEE 802.16 networks. The proposed algorithm

Comparing LORAN Timing Capability to Industrial Requirements

October 23, 2006
Author(s)
Michael A. Lombardi
The telecommunications and electric power industries both operate systems that depend upon precise time synchronization or frequency control. These systems typically use signals from the Global Positioning System (GPS) satellites as their timing source

Future Perspective of RF and Analog/Mixed-Signal Integrated Circuit Technologies for Mobile Communications

October 23, 2006
Author(s)
Bin Zhao, Herbert S. Bennett, Julio Costa, Peter Cottrell, Anthony A. Immorlica, Margaret Huang, Jan-Erik Mueller, Marco Racanelli, Hisashi Shichijo, Charles E. Weitzel
Radio frequency (RF) and analog/mixed-signal (AMS) integrated circuits (ICs) are key enabling components for mobile and wireless communications and their advancements continue to drive the growth of the related semiconductor market. The circuit and
Displaying 34001 - 34025 of 74175
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